| 2. |
- Mikkelä, M.-H., et al.
(författare)
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Bismuth-oxide nanoparticles : study in a beam and as deposited
- 2024
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Ingår i: Physical Chemistry, Chemical Physics - PCCP. - : Royal Society of Chemistry. - 1463-9076 .- 1463-9084. ; 26:13, s. 10369-10381
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Tidskriftsartikel (refereegranskat)abstract
- Bi2O3 is a promising material for solid-oxide fuel cells (SOFC) due to the high ionic conductivity of some phases. The largest value is reached for its δ-phase, but it is normally stable at temperatures too high for SOFC operation, while nanostructured oxide is believed to have more suitable stabilization temperature. However, to manufacture such a material with a controlled chemical composition is a challenging task. In this work, we investigated the fabrication of nanostructured Bi2O3 films formed by deposition of free Bi-oxide nanoparticles created in situ. The particle-production method was based on reactive sputtering and vapour aggregation. Depending on the fabrication conditions, the nanoparticles contained either a combination of Bi–metal and Bi-oxide, or only Bi-oxide. Prior to deposition, the free particles were probed in the beam – by synchrotron-based photoelectron spectroscopy (PES), which allowed assessing their composition "on the-fly". The nanoparticle films obtained after deposition were studied by PES, scanning electron microscopy, transmission electron microscopy, and electron diffraction. The films' chemical composition, grain dimensions, and crystal structure were probed. Our analysis suggests that our method produced Bi-oxide films in more than one polymorph of Bi2O3.
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| 3. |
- Ek, M., et al.
(författare)
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Electron channelling : challenges and opportunities for compositional analysis of nanowires by TEM
- 2020
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Ingår i: Nanotechnology. - : IOP Publishing. - 0957-4484 .- 1361-6528. ; 31:36
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Tidskriftsartikel (refereegranskat)abstract
- Energy dispersive x-ray spectroscopy in a transmission electron microscope is often the first method employed to characterize the composition of nanowires. Ideally, it should be accurate and sensitive down to fractions of an atomic percent, and quantification results are often reported as such. However, one can often get substantial errors in accuracy even though the precision is high: for nanowires it is common for the quantified V/III atomic ratios to differ noticeably from 1. Here we analyse the origin of this systematic error in accuracy for quantification of the composition of III-V nanowires. By varying the electron illumination direction, we find electron channelling to be the primary cause, being responsible for errors in quantified V/III atomic ratio of 50%. Knowing the source of the systematic errors is required for applying appropriate corrections. Lastly, we show how channelling effects can provide information on the crystallographic position of dopants.
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