| 1. |
- Stenarson, Jörgen, et al.
(författare)
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An in-circuit, non-contacting, measurement method for S-parameters and power in planar circuits
- 2001
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Ingår i: IEEE transactions on microwave theory and techniques. ; 49:12, s. 2567-2572
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Tidskriftsartikel (refereegranskat)abstract
- A method for measuring the reflection coefficient and absolute power in the propagating waves from a circuit embedded in a planar circuit environment is presented. The method utilizes a pair of inductive and capacitive probes. The standard one-port vector-network-analyzer calibration is extended to allow the measurement of power in the forward and backward waves. Experimental results are presented for measurements between 700 MHz and 20 GHz. Good agreement between the new noncontacting method and a standard coaxial measurement method is demonstrated up to 12 GHz for power and up to 14 GHz for the reflection coefficient. The method is useful for in-circuit testing of open transmission-line structures, e.g., microstrip.
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| 2. |
- Stenarson, Jörgen, et al.
(författare)
-
An in-circuit, non-contacting, S-para-meter measurement method
- 2001
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Ingår i: Proceedings of 57th ARFTG Conference, 2001..
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Konferensbidrag (refereegranskat)abstract
- A method for measuring S-parameters of a circuit embedded in a planar circuit environment is presented. The method utilizes an inductive and a capacitive probe. Experimental results are presented for probe measurements of reflection coefficient from 0.7 to 20 GHz with good agreement to verifying measurements up to 14 GHz. The method shows great promise for in-circuit Sparameter testing that has previously required physical modification or even complete disassembly to test sub-circuits in a microstrip environment.
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| 3. |
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