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- Yamada, Y., et al.
(författare)
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Antidazzle effect of switchable mirrors prepared on substrates with rough surface
- 2008
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Ingår i: Solar Energy Materials and Solar Cells. - : Elsevier BV. - 0927-0248 .- 1879-3398. ; 92:12, s. 1617-1620
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Tidskriftsartikel (refereegranskat)abstract
- To examine the antidazzle effect of switchable mirrors, mirrors based on a magnesium-nickel alloy were prepared on three kinds of transparent substrates with different surface roughness. The mirrors prepared using a direct-current magnetron sputtering method have nearly the same surface morphology and roughness as the underlying substrates. The diffuse fraction of the total reflectance of the mirrors increases with surface roughness of the mirrors. Thus. by utilizing substrates with rough surfaces, the specular reflectance of the mirrors decreases and consequently it is possible to prepare switchable mirrors with an antidazzle effect.
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- Yamada, Y., et al.
(författare)
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Estimation of the amount of the proton injected into tungsten oxide thin films during deposition using spectroscopic ellipsometry
- 2007
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Ingår i: Thin Solid Films. - : Elsevier BV. - 0040-6090 .- 1879-2731. ; 515:7-8, s. 3825-3829
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Tidskriftsartikel (refereegranskat)abstract
- Tungsten oxide thin films injected with protons (HxWO3) during deposition were prepared on glass substrates using reactive direct-current magnetron sputtering in a mixture of argon, oxygen, and hydrogen gases. The as-deposited films were bronze. The amount of injected protons, namely the x-value in HxWO3, was estimated using the dispersion of the extinction coefficient (κ). The dispersion was evaluated by analyzing the experimental spectra measured with spectroscopic ellipsometry and optical photometry using the model composed of a homogeneous tungsten bronze layer with an additional surface roughness layer. As a result of analysis, the x-value was estimated to be approximately 0.1.
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- Yamada, Y., et al.
(författare)
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Optical properties of tungsten oxide thin films with protons intercalated during sputtering
- 2008
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Ingår i: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 103:6, s. 063508-063508-4
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Tidskriftsartikel (refereegranskat)abstract
- Tungsten oxide thin films with protons intercalated during deposition (HxWO3) were prepared using reactive direct-current-magnetron sputtering in a gas mixture of argon, oxygen, and hydrogen. The as-deposited films fabricated under suitable conditions were colored due to the formation of tungsten bronze. The concentration of intercalated protons, given by the x values in HxWO(3), was evaluated by ejecting protons electrochemically from the films. The x value of the films prepared at a constant working pressure was found to be proportional to the hydrogen flow ratio during deposition. On the other hand, the x value of the films prepared at a constant hydrogen flow ratio decreased sharply with increasing working pressure during deposition. The dispersion of the extinction coefficient (kappa) of the films was estimated by analyzing the experimental spectra of psi and Delta measured with spectroscopic ellipsometry using the model composed of a homogeneous tungsten bronze layer with an additional surface roughness layer. As a result of this analysis, the kappa value was found to increase sharply with the number of intercalated protons. There was a linear dependence between the kappa value and the x value for x 0.2, while for x 0.3, the absorption saturated. This indicates that it is possible to evaluate the x value of HxWO3 films using spectroscopic ellipsometry.
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- Yamada, Y, et al.
(författare)
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Real time characterization of hydrogenation mechanism of palladium thin films by in situ spectroscopic ellipsometry
- 2009
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Ingår i: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 106:1, s. 013523-
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Tidskriftsartikel (refereegranskat)abstract
- The hydrogenation mechanism of Pd thin films was analyzed in real time by measuring the variation in ellipsometric Psi and Delta using in situ spectroscopic ellipsometry. In the initial stage, the hydrogenation proceeded from the film surface and a mixture layer of metal and hydride, not a uniform hydride layer, was formed at the surface. With time evolution, the thickness of the mixture layer increased and that of the Pd metal layer decreased rapidly. After the whole Pd metal layer changed to the mixture layer, the concentration of hydride in the mixture layer increased. Finally, the concentration reached one and hydrogenation of Pd was finished.
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