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Direct experimental...
Direct experimental verification of shot noise in short channel MOS transistors
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- Andersson, Stefan, 1975- (författare)
- Linköpings universitet,Tekniska högskolan,Elektroniska komponenter
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- Svensson, Christer, 1941- (författare)
- Linköpings universitet,Tekniska högskolan,Elektroniska komponenter
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(creator_code:org_t)
- Institution of Engineering and Technology (IET), 2005
- 2005
- Engelska.
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Ingår i: Electronics Letters. - : Institution of Engineering and Technology (IET). - 0013-5194 .- 1350-911X. ; 41:15, s. 869-871
- Relaterad länk:
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https://urn.kb.se/re...
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visa fler...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Drain noise current was measured at an extended temperature range on n-MOS transistors of various lengths made in a 0.18 urn process. A comparison with theoretical noise models strongly indicates the mechanism of shot noise produced near the source by diffusion currents, as proposed by Obrecht et al. © IEE 2005.
Nyckelord
- experimental verification
- shot noise
- short channel MOS
- TECHNOLOGY
- TEKNIKVETENSKAP
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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