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NiFe2O4 and Fe3O4 studied by XMCD and resonant photoemission

Richter, M. C. (author)
Mariot, J. -M. (author)
Heckmann, O. (author)
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Kjeldgaard, Lisbeth (author)
Lund University,Lunds universitet,MAX IV-laboratoriet,MAX IV Laboratory
Mun, B. S. (author)
Fadley, C. S. (author)
Lueders, U. (author)
Bobo, J. -F. (author)
De Padova, P. (author)
Taleb-Ibrahimi, A. (author)
Hricovini, K. (author)
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 (creator_code:org_t)
2009-05-10
2009
English.
In: The European Physical Journal. Special Topics. - : Springer Science and Business Media LLC. - 1951-6355 .- 1951-6401. ; 169, s. 175-180
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • X-ray magnetic circular dichroism and resonant photoemission at the Fe and Ni L-2,L-3 edges have been used to investigate the electronic structure of NiFe2O4 (NFO) thin films. The results, when compared to those obtained on Fe3O4, indicate that in a 12 nm NFO film the Ni atoms occupy mainly B sites, as in bulk NFO, and that a decrease in the thickness of the film results in a modi. cation of the nickel hybridization.

Subject headings

NATURVETENSKAP  -- Fysik (hsv//swe)
NATURAL SCIENCES  -- Physical Sciences (hsv//eng)

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art (subject category)
ref (subject category)

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