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Nano-XRF and micro-...
Nano-XRF and micro-Raman Studies of Metal Impurity Decoration around Dislocations in Multicrystalline Silicon
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- Bertoni, M. I. (författare)
- Arizona State Univ, USA
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- Sarau, G. (författare)
- Germany
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Fenning, D. P. (författare)
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- Rinio, Markus (författare)
- Karlstads universitet,Institutionen för ingenjörsvetenskap och fysik (from 2013),Frauenhofer ISE, Germany
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- Rose, V. (författare)
- USA
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- Maser, J. (författare)
- USA
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- Buonassisi, T. (författare)
- USA
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(creator_code:org_t)
- New York, USA : IEEE, 2012
- 2012
- Engelska.
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Ingår i: 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC). - New York, USA : IEEE. - 9781467300667 ; , s. 1613-1616
- Relaterad länk:
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https://urn.kb.se/re...
Abstract
Ämnesord
Stäng
- We push the resolution limits of synchrotron-based nano-X-ray fluorescence mapping below 100 nm to investigate the fundamental differences between benign and deleterious dislocations in multicystalline silicon solar cells. We observe that after processing recombination-active dislocations contain a high degree of nanoscale iron and copper decoration, while recombination-inactive dislocations appear clean. To study the origins of the distinct metal decorations around different dislocations we analyze as-grown samples as well as specimens at different stages of processing. We complement our X-ray studies with micro-Raman mapping to understand the relationship between metallic decoration and stress fields around dislocations.
Ämnesord
- NATURVETENSKAP -- Fysik -- Annan fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Other Physics Topics (hsv//eng)
Nyckelord
- dislocations
- silicon solar cells
- X-ray fluorescence
- micro-Raman
- Physics
- Fysik
Publikations- och innehållstyp
- ref (ämneskategori)
- kon (ämneskategori)
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