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Two-tone PLL for on-chip IP3 test

Ahmad, Shakeel, 1977- (author)
Linköpings universitet,Elektroniska komponenter,Tekniska högskolan
Azizi, Kaveh (author)
Linköpings universitet,Elektroniska komponenter,Tekniska högskolan
Esmaeil Zadeh, Iman (author)
Linköpings universitet,Elektroniska komponenter,Tekniska högskolan
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Dabrowski, Jerzy, 1952- (author)
Linköpings universitet,Elektroniska komponenter,Tekniska högskolan
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 (creator_code:org_t)
IEEE, 2010
2010
English.
In: Proceedings of IEEEInternational Symposium on Circuits and Systems, (ISCAS 10). - : IEEE. - 9781424453085 ; , s. 3549-3552
  • Conference paper (peer-reviewed)
Abstract Subject headings
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  • This paper addresses a built-in-self-test (BiST) to characterize IP3 linearity of a RF receiver front-end. A two-tone stimulus is generated by a phase-lock loop (PLL) in GHz frequency range. The PLL is designed to keep the frequency difference between the two tones under control and in this way to avoid a possible injection-locking. One of the oscillation frequencies and the difference (beat) frequency can be externally controlled. According to the test requirements the phase noise and nonlinear distortion of the two-tone generator are considered as a merit for the VCO and analog adder design. A highly linear analog adder with output referred IP3 of more than +15 dBm is used to generate the RF stimulus. The two-tone power across 50 Ω receiver input impedance can be more than -25 dBm with very low intermodulation distortion of PIM3 = -75 dBc. The receiver performance is not affected significantly by the test set-up. Simulations for linearity and noise performance of the PLL designed in 65nm CMOS show sufficient potential for on-chip IP3 measurements in the GHz frequency range.

Keyword

TECHNOLOGY
TEKNIKVETENSKAP

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