1. |
- Geprags, Stephan, et al.
(author)
-
Precise control of J(eff)=1/2 magnetic properties in Sr2IrO4 epitaxial thin films by variation of strain and thin film thickness
- 2020
-
In: Physical Review B. - : AMER PHYSICAL SOC. - 2469-9950 .- 2469-9969. ; 102:21
-
Journal article (peer-reviewed)abstract
- We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal J(eff) = 1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.
|
|