| 1. |
- Zhang, Y., et al.
(författare)
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Dark Energy Surveyed Year 1 results : calibration of cluster mis-centring in the redMaPPer catalogues
- 2019
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Ingår i: Monthly notices of the Royal Astronomical Society. - : OXFORD UNIV PRESS. - 0035-8711 .- 1365-2966. ; 487:2, s. 2578-2593
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Tidskriftsartikel (refereegranskat)abstract
- The centre determination of a galaxy cluster from an optical cluster finding algorithm can be offset from theoretical prescriptions or N-body definitions of its host halo centre. These offsets impact the recovered cluster statistics, affecting both richness measurements and the weak lensing shear profile around the clusters. This paper models the centring performance of the redMaPPer cluster finding algorithm using archival X-ray observations of redMaPPer-selected clusters. Assuming the X-ray emission peaks as the fiducial halo centres, and through analysing their offsets to the redMaPPer centres, we find that similar to 75 +/- 8 per cent of the redMaPPer clusters are well centred and the mis-centred offset follows a Gamma distribution in normalized, projected distance. These mis-centring offsets cause a systematic underestimation of cluster richness relative to the well-centred clusters, for which we propose a descriptive model. Our results enable the DES Y1 cluster cosmology analysis by characterizing the necessary corrections to both the weak lensing and richness abundance functions of the DES Y1 redMaPPer cluster catalogue.
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| 2. |
- Farahi, A., et al.
(författare)
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Mass variance from archival X-ray properties of Dark Energy Survey Year-1 galaxy clusters
- 2019
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Ingår i: Monthly notices of the Royal Astronomical Society. - : OXFORD UNIV PRESS. - 0035-8711 .- 1365-2966. ; 490:3, s. 3341-3354
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Tidskriftsartikel (refereegranskat)abstract
- Using archival X-ray observations and a lognormal population model, we estimate constraints on the intrinsic scatter in halo mass at fixed optical richness for a galaxy cluster sample identified in Dark Energy Survey Year-One (DES-Y1) data with the redMaPPer algorithm. We examine the scaling behaviour of X-ray temperatures, T-X, with optical richness, lambda(RM), for clusters in the redshift range 0.2 < z < 0.7. X-ray temperatures are obtained from Chandra and XMM observations for 58 and 110 redMaPPer systems, respectively. Despite non-uniform sky coverage, the T-X measurements are > 50 per cent complete for clusters with lambda(RM) > 130. Regression analysis on the two samples produces consistent posterior scaling parameters, from which we derive a combined constraint on the residual scatter, sigma(ln) (T) (vertical bar) (lambda) = 0.275 +/- 0.019. Joined with constraints for T-X scaling with halo mass from the Weighing the Giants program and richness-temperature covariance estimates from the LoCuSS sample, we derive the richness-conditioned scatter in mass, sigma(ln) (M) (vertical bar) (lambda) = 0.30 +/- 0.04((stat)) +/- 0.09((sys)), at an optical richness of approximately 100. Uncertainties in external parameters, particularly the slope and variance of the T-X-mass relation and the covariance of T-X and lambda(RM) at fixed mass, dominate the systematic error. The 95 per cent confidence region from joint sample analysis is relatively broad, sigma(ln) (M) (vertical bar) (lambda) is an element of [0.14, 0.55], or a factor 10 in variance.
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| 3. |
- Riazanova, Anastasia, et al.
(författare)
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Gas-assisted electron-beam-induced nanopatterning of high-quality titanium oxide
- 2016
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Ingår i: Nanotechnology. - : Institute of Physics Publishing (IOPP). - 0957-4484 .- 1361-6528. ; 27:11
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Tidskriftsartikel (refereegranskat)abstract
- Electron-beam-induced deposition of titanium oxide nanopatterns is described. The precursor is titanium tetra-isopropoxide, delivered to the deposition point through a needle and mixed with oxygen at the same point via a flow through a separate needle. The depositions are free of residual carbon and have an EDX determined stoichiometry of TiO2.2. High resolution transmission electron microscopy and Raman spectroscopy studies reveal an amorphous structure of the fabricated titanium oxide. Ellipsometric characterization of the deposited material reveals a refractive index of 2.2-2.4 RIU in the spectral range of 500-1700 nm and a very low extinction coefficient (lower than 10(-6) in the range of 400-1700 nm), which is consistent with high quality titanium oxide. The electrical resistivity of the titanium oxide patterned with this new process is in the range of 10-40 G Omega cm and the measured breakdown field is in the range of 10-70 V mu m(-1). The fabricated nanopatterns are important for a variety of applications, including field-effect transistors, memory devices, MEMS, waveguide structures, bio-and chemical sensors.
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