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- Bläckberg, Lisa, et al.
(författare)
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Investigations of surface coatings to reduce memory effect in plastic scintillator detectors used for radioxenon detection
- 2011
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Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - : Elsevier BV. - 0168-9002 .- 1872-9576. ; 656:1, s. 84-91
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Tidskriftsartikel (refereegranskat)abstract
- In this work Al(2)O(3) and SiO(2) coatings are tested as Xe diffusion barriers on plastic scintillator substrates. The motivation is improved beta-gamma coincidence detection systems, used to measure atmospheric radioxenon within the verification regime of the Comprehensive Nuclear-Test-Ban Treaty. One major drawback with the current setup of these systems is that the radioxenon tends to diffuse into the plastic scintillator material responsible for the beta detection, resulting in an unwanted memory effect. Here, coatings with thicknesses between 20 and 900 nm have been deposited onto plastic scintillators, and investigated using two different experimental techniques. The results show that all tested coatings reduce the Xe diffusion into the plastic. The reduction is observed to increase with coating thickness for both coating materials. The 425 nm Al(2)O(3) coating is the most successful one, presenting a diffusion reduction of a factor 100, compared to uncoated plastic. In terms of memory effect reduction this coating is thus a viable solution to the problem in question.
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- Bläckberg, Lisa, et al.
(författare)
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Memory effect, resolution, and efficiency measurements of an Al2O3 coated plastic scintillator used for radioxenon detection
- 2013
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Ingår i: Nuclear Instruments and Methods in Physics Research Section A. - : Elsevier BV. - 0168-9002 .- 1872-9576. ; 714, s. 128-135
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Tidskriftsartikel (refereegranskat)abstract
- A cylindrical plastic scintillator cell, used for radioxenon monitoring within the verification regime of the Comprehensive Nuclear-Test-Ban Treaty, has been coated with 425 nm Al2O3 using low temperature Atomic Layer Deposition, and its performance has been evaluated. The motivation is to reduce the memory effect caused by radioxenon diffusing into the plastic scintillator material during measurements, resulting in an elevated detection limit. Measurements with the coated detector show both energy resolution and efficiency comparable to uncoated detectors, and a memory effect reduction of a factor of 1000. Provided that the quality of the detector is maintained for a longer period of time, Al2O3 coatings are believed to be a viable solution to the memory effect problem in question.
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- Martensson, Nils, et al.
(författare)
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On the relation between X-ray Photoelectron Spectroscopy and XAFS
- 2013
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Ingår i: 15th International Conference On X-Ray Absorption Fine Structure (XAFS15). - : IOP Publishing.
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Konferensbidrag (refereegranskat)abstract
- XAFS and X-ray Photoelectron Spectroscopy (XPS) are element specific techniques used in a great variety of research fields. The near edge regime of XAFS provides information on the unoccupied electronic states of a system. For the detailed interpretation of the XAFS results, input from XPS is crucial. The combination of the two techniques is also the basis for the so called core-hole clock technique. One of the important aspects of photoelectron spectroscopy is its chemical sensitivity and that one can obtain detailed information about the composition of a sample. We have for a series of carbon based model molecules carefully investigated the relationship between core level photoelectron intensities and stoichiometry. We find strong EXAFS-like modulations of the core ionization cross sections as function of photon energy and that the intensities at high photon energies converge towards values that do not correspond to the stoichiometric ratios. The photoelectron intensities are dependent on the local molecular structure around the ionized atoms. These effects are well described by molecular calculations using multiple scattering theory and by considering the effects due to monopole shake-up and shake-off as well as to intramolecular inelastic scattering processes.
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