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Träfflista för sökning "WFRF:(Klinger M) srt2:(2010-2014)"

Sökning: WFRF:(Klinger M) > (2010-2014)

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NumreringReferensOmslagsbildHitta
231.
  • Aad, G., et al. (författare)
  • 2014
  • Ingår i: Journal of High Energy Physics. - : Springer. - 1029-8479 .- 1126-6708. ; :4
  • Tidskriftsartikel (refereegranskat)
  •  
232.
  • Aad, G., et al. (författare)
  • 2014
  • Ingår i: Journal of High Energy Physics. - : Springer. - 1029-8479 .- 1126-6708. ; :5, s. 1-52
  • Tidskriftsartikel (refereegranskat)
  •  
233.
  • Aad, G., et al. (författare)
  • 2014
  • Ingår i: European Physical Journal C. Particles and Fields. - : Springer. - 1434-6044 .- 1434-6052. ; 74:8
  • Tidskriftsartikel (refereegranskat)
  •  
234.
  • Aad, G., et al. (författare)
  • 2014
  • Tidskriftsartikel (refereegranskat)
  •  
235.
  • Aad, G., et al. (författare)
  • 2014
  • Tidskriftsartikel (refereegranskat)
  •  
236.
  • Aad, G., et al. (författare)
  • 2013
  • Tidskriftsartikel (refereegranskat)
  •  
237.
  • Aad, G., et al. (författare)
  • 2014
  • Ingår i: Journal of High Energy Physics. - : Springer. - 1029-8479 .- 1126-6708. ; :4
  • Tidskriftsartikel (refereegranskat)
  •  
238.
  • Aad, G., et al. (författare)
  • 2014
  • swepub:Mat__t
  •  
239.
  • Hajkova, V., et al. (författare)
  • X-ray laser-induced ablation of lead compounds
  • 2011
  • Ingår i: DAMAGE TO VUV, EUV, AND X-RAY OPTICS III.
  • Konferensbidrag (refereegranskat)abstract
    • The recent commissioning of a X-ray free-electron laser triggered an extensive research in the area of X-ray ablation of high-Z, high-density materials. Such compounds should be used to shorten an effective attenuation length for obtaining clean ablation imprints required for the focused beam analysis. Compounds of lead (Z=82) represent the materials of first choice. In this contribution, single-shot ablation thresholds are reported for PbWO(4) and PbI(2) exposed to ultra-short pulses of extreme ultraviolet radiation and X-rays at FLASH and LCLS facilities, respectively. Interestingly, the threshold reaches only 0.11 J/cm(2) at 1.55 nm in lead tungstate although a value of 0.4 J/cm(2) is expected according to the wavelength dependence of an attenuation length and the threshold value determined in the XUV spectral region, i.e., 79 mJ/cm(2) at a FEL wavelength of 13.5 nm. Mechanisms of ablation processes are discussed to explain this discrepancy. Lead iodide shows at 1.55 nm significantly lower ablation threshold than tungstate although an attenuation length of the radiation is in both materials quite the same. Lower thermal and radiation stability of PbI(2) is responsible for this finding.
  •  
240.
  • Iwan, Bianca S, et al. (författare)
  • TOF-OFF : A method for determining focal positions in tightly focused free-electron laser experiments by measurement of ejected ions
  • 2011
  • Ingår i: High Energy Density Physics. - 1574-1818. ; 7:4, s. 336-342
  • Tidskriftsartikel (refereegranskat)abstract
    • Pulse intensities greater than 1017 Watt/cm2 were reached at the FLASH soft X-ray laser in Hamburg, Germany, using an off-axis parabolic mirror to focus 15 fs pulses of 5–70 μJ energy at 13.5 nm wavelength to a micron-sized spot. We describe the interaction of such pulses with niobium and vanadium targets and their deuterides. The beam produced craters in the solid targets, and we measured the kinetic energy of ions ejected from these craters. Ions with several keV kinetic energy were observed from craters approaching 5 μm in depth when the sample was at best focus. We also observed the onset of saturation in both ion acceleration and ablation with pulse intensities exceeding 1016 W/cm2, when the highest detected ion energies and the crater depths tend to saturate with increasing intensity. A general difficulty in working with micron and sub-micron focusing optics is finding the exact focus of the beam inside a vacuum chamber. Here we propose a direct method to measure the focal position to a resolution better than the Rayleigh length. The method is based on the correlation between the energies of ejected ions and the physical dimensions of the craters. We find that the focus position can be quickly determined from the ion time-of-flight (TOF) data as the target is scanned through the expected focal region. The method does not require external access to the sample or venting the vacuum chamber. Profile fitting employed to analyze the TOF data can extend resolution beyond the actual scanning step size.
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