| 1. |
- Jokubavicius, Valdas, et al.
(author)
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Effects of source material on epitaxial growth of fluorescent SiC
- 2012
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In: Thin Solid Films. - : Elsevier. - 0040-6090 .- 1879-2731. ; 522, s. 7-10
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Journal article (peer-reviewed)abstract
- The growth of fluorescent SiC using Fast Sublimation Growth Process was demonstrated using different types of SiC source materials. These were prepared by (i) high-temperature hot pressing, (ii) chemical vapor deposition and (iii) physical vapor transport. The optimized growth rates of 50 μm/h, 170 μm/h and 200 μm/h were achieved using the three types of sources, respectively. The best results in respect to growth rates are obtained using higher density sources. Fluorescent SiC layers with mirror-like morphology, very good crystal quality and yellowish or warm white light photoluminescence at room temperature were grown using all three types of the source materials.
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| 2. |
- Kamiyama, Satoshi, et al.
(author)
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White light-emitting diode based on fluorescent SiC
- 2012
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In: Thin Solid Films. - : Elsevier. - 0040-6090 .- 1879-2731. ; 522, s. 23-25
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Journal article (peer-reviewed)abstract
- A monolithic white light-emitting diode (LED,) comprising a combination of a fluorescent-SiC (f-SiC) substrate and a nitride-based near-UV LED stack, is proposed. On the basis of the recombination of donor and acceptor pairs, the f-SiC substrate works as a phosphor for visible light emission. By employing the Fast Sublimation Growth Process method, the high-quality f-SiC substrate doped with N and B exhibited a nonradiative carrier lifetime of 55 mu s and an internal quantum efficiency (IQE) of 40%. With increasing donor and acceptor doping concentrations, a high IQE was estimated even at a high excitation level.
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| 3. |
- Pecz, B, et al.
(author)
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Structural investigation of SiC epitaxial layers grown under microgravity and on-ground conditions
- 1999
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In: Thin Solid Films. - 0040-6090 .- 1879-2731. ; 357:2, s. 137-143
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Journal article (peer-reviewed)abstract
- Thick 4H-, and 6H-SiC epitaxial layers have been grown by LPE from Si-Sc-C solvent at microgravity conditions during a space experiment, as well as on-ground. The samples are characterised by cross-sectional TEM and HRXRD. Layers grown at microgravity are relatively defect free, although their surfaces are always stepped. Control samples grown on-ground have similar surface appearance, but contain scandium carbide precipitates, nanopipes, micropipes and/or cavities as verified by TEM. However, none of the aforementioned defects was traced in the layers grown at microgravity conditions. So, samples grown at space microgravity conditions are superior in their defect structure to those ones grown on the ground. The defects called nanopipes can be described as empty pipes of about 200 nm diameter traversing the layer in the [0001] (growth) direction. The steps in the microgravity and on-ground samples have facets of {104} type crystallographic planes both in 6H-, and 4H-SiC. We suggest, that those facets are formed and preferred during growth due to a possible mechanism of decreasing the high energy of the growing Si terminated (0001) surface. (C) 1999 Elsevier Science S.A. All rights reserved.
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| 4. |
- Sun, Jianwu, et al.
(author)
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Room temperature luminescence properties of fluorescent SiC as white light emitting diode medium
- 2012
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In: Thin Solid Films. - : Elsevier. - 0040-6090 .- 1879-2731. ; 522, s. 33-35
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Journal article (peer-reviewed)abstract
- The high quantum efficiency of donor–acceptor-pair emission in N and B co-doped 6H–SiC opens the way for SiC to constitute as an efficient light-emitting medium for white light-emitting diodes. In this work, we evidence room temperature luminescence in N and B co-doped 6H–SiC fluorescent material grown by the Fast Sublimation Growth Process. Three series of samples, with eight different N and B doping levels, were investigated. In most samples, from photoluminescence measurements a strong N–B donor–acceptor-pair emission band was observed at room temperature, with intensity dependent on the nitrogen pressure in the growth chamber and boron doping level in the source. Low temperature photoluminescence spectra showed that N bound exciton peaks exhibited a continuous broadening with increasing N2 pressure during the growth, unambiguously indicating an opportunity to control the N doping in the epilayer by conveniently changing the N2 pressure. Finally, the crystal quality of the N and B doped 6H–SiC was evaluated by X-ray diffraction measurements. The ω rocking curves of (0006) Bragg diffractions from the samples grown with lower and higher N2 pressure show almost the same value of the full width at half maximum as that collected from the substrate. This suggests that the N and B doping, which is expected to give rise to an efficient donor–acceptor-pair emission at room temperature, does not degrade the crystal quality.
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