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- Schuermans, Steven, et al.
(författare)
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An On-Chip Mach-Zehnder Interferometer in the Microwave Regime
- 2011
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Ingår i: IEEE Transactions on Applied Superconductivity. - : Institute of Electrical and Electronics Engineers (IEEE). - 1558-2515 .- 1051-8223. ; 21:3, s. 448-451
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Tidskriftsartikel (refereegranskat)abstract
- The design, simulation and measurements of an on-chip Mach-Zehnder interferometer operating in the microwave regime are described. Using microwave signals in microfabricated superconducting Al waveguides, the concept of an interferometer is transferred from optics to on-chip. Tuning of the path length of one of the interferometer arms is executed through the tunable inductance of a SQUID. By placing one or more SQUIDs in the waveguide structure and by varying the magnetic flux through the SQUID loop, the total SQUID inductance can be tuned. In this way, a phase difference leading to destructive or constructive interference at the interferometer output can be achieved. Thorough software simulations were performed to determine the different design parameters, assign a desired working frequency and provide a reference for comparison with experimental results. Measurements at 300 mK show an effective working frequency close to the simulations, with a deviation smaller than 0.05 GHz. The behavior of the interferometer is very similar to the simulations as well. The on-off ratio exceeds 40 dB.
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2. |
- Shaw, M. D., et al.
(författare)
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Experimental realization of a differential charge qubit
- 2007
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Ingår i: IEEE Transactions on Applied Superconductivity. - 1558-2515 .- 1051-8223. ; 17:2, s. 109-112
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Tidskriftsartikel (refereegranskat)abstract
- We demonstrate the operation of a differential single Cooper-pair box, a charge qubit consisting of two aluminum islands, isolated from ground, coupled by a pair of small-area Josephson junctions. We have tested four devices, all of which show evidence of quasiparticle poisoning. The devices are characterized with microwave spectroscopy and temperature dependence studies. © 2007 IEEE.
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