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Characterization of InSb QDs grown on InAs (100) substrate by MBE and MOVPE

Karim, Amir (författare)
Acreo
Gustafsson, Oscar (författare)
KTH,Integrerade komponenter och kretsar
Hussain, Liaq (författare)
Acrero
visa fler...
Wang, Q. (författare)
Noharet, B. (författare)
Hammar, Mattias (författare)
KTH,Integrerade komponenter och kretsar
Anderson, J. (författare)
Song, J. (författare)
visa färre...
 (creator_code:org_t)
SPIE, 2012
2012
Engelska.
Ingår i: Proc SPIE Int Soc Opt Eng. - : SPIE. - 9780819491312
  • Konferensbidrag (refereegranskat)
Abstract Ämnesord
Stäng  
  • We report on the optical and structural characterization of InSb QDs in InAs matrix, grown on InAs (100) substrates, for infrared photodetection. InSb has 7% lattice mismatch with InAs forming strained QDs, which are promising for longwave IR applications, due to their type-II band alignment. This report contains material development results of InSb QDs for increasing their emission wavelength towards long-wave IR region. Samples were grown by two techniques of MBE and MOVPE, with different InSb coverage on InAs (100) substrates. Structures grown by MBE reveal QD related photoluminescence at 4 μm. AFM investigations of the MBE grown structures showed uncapped dots of ∼ 35 nm in size and ∼ 3 nm in height, with a density of about 2 × 1010 cm -2. Cross-section TEM investigations of buried InSb layers grown by MBE showed coherently strained QDs for nominal InSb coverage in the range of 1.6 - 2 monolayers (MLs). Layers with InSb coverage more than 2MLs contain relaxed QDs with structural defects due to large amount of strain between InSb and InAs. Samples with such large dots did not show any InSb related luminescence. The MOVPE grown InSb samples exhibit a strong QD related emission between 3.8 to 7.5 μm, depending on the amount of InSb coverage and other growth parameters. We report the longest wavelength observed so far in this material system.

Ämnesord

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)

Nyckelord

InAs
Infrared
InSb QDs
MBE
MOVPE
Photodetector
Photoluminescence
TEM
AFM
Band alignments
Emission wavelength
Grown structures
Growth parameters
Long waves
Material development
Material systems
Photo detection
Structural characterization
Structural defect
Indium arsenide
Infrared radiation
Metallorganic vapor phase epitaxy
Molecular beam epitaxy
Monolayers
Photodetectors
Substrates
Transmission electron microscopy
Indium antimonides

Publikations- och innehållstyp

ref (ämneskategori)
kon (ämneskategori)

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