SwePub
Tyck till om SwePub Sök här!
Sök i LIBRIS databas

  Extended search

WFRF:(Song Yuxin 1981)
 

Search: WFRF:(Song Yuxin 1981) > (2012) > Sadeghi Mahdad 1964 > High quality strain...

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist

High quality strain-compensated multiple InAs/GaNAs quantum dot layers grown by MBE

Ye, Hong, 1987 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Song, Yuxin, 1981 (author)
Chalmers tekniska högskola,Chalmers University of Technology
Sadeghi, Mahdad, 1964 (author)
Chalmers tekniska högskola,Chalmers University of Technology
show more...
Gu, Yi (author)
Wang, Shu Min, 1963 (author)
Chalmers tekniska högskola,Chalmers University of Technology
show less...
 (creator_code:org_t)
2012
2012
English.
In: 39th International Symposium on Compound Semiconductors (ISCS2012), Santa Barbara, CA, USA, August 27-30, 2012.
  • Conference paper (peer-reviewed)
Subject headings
Close  

Subject headings

TEKNIK OCH TEKNOLOGIER  -- Elektroteknik och elektronik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
TEKNIK OCH TEKNOLOGIER  -- Nanoteknik (hsv//swe)
ENGINEERING AND TECHNOLOGY  -- Nano-technology (hsv//eng)

Publication and Content Type

kon (subject category)
ref (subject category)

To the university's database

  • 1 of 1
  • Previous record
  • Next record
  •    To hitlist

Find more in SwePub

By the author/editor
Ye, Hong, 1987
Song, Yuxin, 198 ...
Sadeghi, Mahdad, ...
Gu, Yi
Wang, Shu Min, 1 ...
About the subject
ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Electrical Engin ...
ENGINEERING AND TECHNOLOGY
ENGINEERING AND ...
and Nano technology
Articles in the publication
By the university
Chalmers University of Technology

Search outside SwePub

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Close

Copy and save the link in order to return to this view