WFRF:(Wang Min)
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The band offset and the critical layer thickness in III-V compound semiconductor heterostructures
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- Wang, Shu Min, 1963 (author)
- Chalmers tekniska högskola,Chalmers University of Technology
- (creator_code:org_t)
- ISBN 9914001130
- 1992
- English.
- Licentiate thesis (other academic/artistic)
Subject headings
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Subject headings
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Keyword
- interface morphology
- molecular beam epitaxy
- band offset
- transmission electron microscopy
- InGaAs
- strain
- photoluminescence
- critical layer thickness
- quantum wells
- heterostructures
- III-V compounds
Publication and Content Type
- lic (subject category)
- vet (subject category)
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