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Dynamic avalanche i...
Dynamic avalanche in 3.3-kV Si power diodes
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- Domeij, Martin (författare)
- KTH,Elektronik
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- Breitholtz, Bo (författare)
- KTH,Elektronik
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- Hillkirk, Leonardo (författare)
- KTH,Elektronik
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- Linnros, Jan (författare)
- KTH,Elektronik
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- Östling, Mikael (författare)
- KTH,Elektronik
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(creator_code:org_t)
- Institute of Electrical and Electronics Engineers (IEEE), 1999
- 1999
- Engelska.
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Ingår i: IEEE Transactions on Electron Devices. - : Institute of Electrical and Electronics Engineers (IEEE). - 0018-9383 .- 1557-9646. ; 46:4, s. 781-786
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Measurements of the safe reverse recovery limit were performed for 3.3-kV Si power diodes using a novel optical experimental technique. In this experiment, influence of the junction termination is effectively eliminated by optical generation of a laterally-localized carrier plasma. The turn-off failures observed in measurements at two temperatures showed no temperature dependence and could not be reproduced in ordinary one-dimensional (1-D) or two-dimensional (2-D) device simulations. To simulate the stability of the current density toward current filamentation, two 1-D diodes with an area ratio 1:19 and a 10% difference in initial carrier plasma level, were simulated in parallel. This resulted in a strongly inhomogeneous current distribution, and a rapid reverse voltage fall resembling the measured turn-off failures. Inhomogeneous current distribution in these simulations appears as the current decay ceases due to impact ionization, in qualitative agreement with a current instability condition proposed by Wachutka [1].
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- dynamic avalanche
- impact ionization
- power diode
- reverse recovery
- SOA
- turn-off failure
- Electrical engineering, electronics and photonics
- Elektroteknik, elektronik och fotonik
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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