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Characterization of...
Characterization of heteroepitaxial Na0.5K0.5NbO3/La0.5Sr0.5CoO3 electro-optical cell
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- Khartsev, Sergiy (författare)
- KTH,Mikroelektronik och Informationsteknik, IMIT
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- Grishin, Michael A. (författare)
- KTH,Mikroelektronik och Informationsteknik, IMIT
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- Grishin, Alexander M. (författare)
- KTH,Mikroelektronik och Informationsteknik, IMIT
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(creator_code:org_t)
- AIP Publishing, 2005
- 2005
- Engelska.
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Ingår i: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 86:6, s. 062901-1-062901-3
- Relaterad länk:
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https://urn.kb.se/re...
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visa fler...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Heteroepitaxial Na0.5K0.5NbO3(1.5 mum)/La0.5Sr0.5CoO3(0.5 mum) (NKN/LSCO) films were grown on an Al2O3(0112) single crystal (r-cut sapphire) by rf-magnetron sputtering (NKN) and pulsed laser deposition (LSCO) techniques. Prism coupling waveguide refractometry has been employed to characterize vertical capacitive electro-optical cells with 2 X 8 mm(2) semitransparent Au top electrodes. Fitting reflectivity spectra to Fresnel formulas yields extraordinary and ordinary refractive indices n(e) = 2.232 and n(o) = 2.234 as well as electro-optic coefficient r(13) = 17.4 pm/V. Dispersion of the refraction index follows the Sellmeier formula n(2) = 1 + 3.46/[1-(244 nm/lambda)(2)] in the range from 400 nm to 850 nm.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- na0.5k0.5nbo3 thin-films
- chemical-vapor-deposition
- pulsed-laser deposition
- knbo3 single-crystal
- growth
- sapphire
- Electrophysics
- Elektrofysik
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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