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Direct characteriza...
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Tian, JieDepartment of Microelectronics and Applied Physics, Royal Institute of Technology, Electrum 229, Kista, Sweden,KTH,Microphotonics
(författare)
Direct characterization of focusing light by negative refraction in a photonic crystal flat lens
- Artikel/kapitelEngelska2008
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New York :AIP Publishing,2008
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LIBRIS-ID:oai:DiVA.org:kth-17978
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-17978URI
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https://doi.org/10.1063/1.3027069DOI
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https://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-221290URI
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https://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-107041URI
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Språk:engelska
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Sammanfattning på:engelska
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Ämneskategori:ref swepub-contenttype
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Ämneskategori:art swepub-publicationtype
Anmärkningar
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QC 20100525
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We report experimental measurements of the field distribution of the light spot focused by a two-dimensional photonic crystal flat lens at wavelengths 1.51-1.58 mu m. The photonic crystal slab is fabricated on a silicon-on-insulator substrate by focused-ion-beam direct milling. We confirm the light focusing by the photonic crystal slab through direct observation of the light spot entering into free space at the end facet of the slab lens. The beam profiles as the function of lateral position are measured and the minimal full width half maximum of the beam at 1.2 mu m (0.77 lambda) is obtained.
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Yan, MinDepartment of Microelectronics and Applied Physics, Royal Institute of Technology, Electrum 229, Kista, Sweden(Swepub:umu)maya0028
(författare)
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Qiu, MinKTH,Mikroelektronik och tillämpad fysik, MAP,Department of Microelectronics and Applied Physics, Royal Institute of Technology, Electrum 229, Kista, Sweden(Swepub:kth)u11okd66
(författare)
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Ribbing, Carl-Gustaf,1942-Uppsala universitet,Fasta tillståndets fysik,Solid State Physics(Swepub:uu)cri26208
(författare)
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Liu, Ya-ZhaoOptical Physics Lab, Institute of Physics, Chinese Academy of Science, Beijing, China
(författare)
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Zhang, Dao-ZhongOptical Physics Lab, Institute of Physics, Chinese Academy of Science, Beijing, China
(författare)
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Li, Zhi-YuanOptical Physics Lab, Institute of Physics, Chinese Academy of Science, Beijing, China
(författare)
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Department of Microelectronics and Applied Physics, Royal Institute of Technology, Electrum 229, Kista, SwedenKTH
(creator_code:org_t)
Sammanhörande titlar
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Ingår i:Applied Physics LettersNew York : AIP Publishing93:190003-69511077-3118
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