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Seebeck coefficient of nanostructured phosphorus-alloyed bismuth telluride thick films

Zhou, Jie (author)
KTH,Materialvetenskap
Li, Shuai (author)
KTH,Materialvetenskap
Soliman, Herrera M. A. (author)
KTH,Materialvetenskap
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Toprak, Muhammet S. (author)
KTH,Materialvetenskap
Muhammed, Mamoun (author)
KTH,Materialvetenskap
Platzek, D. (author)
Mueller, E. (author)
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 (creator_code:org_t)
Elsevier BV, 2009
2009
English.
In: Journal of Alloys and Compounds. - : Elsevier BV. - 0925-8388 .- 1873-4669. ; 471:1-2, s. 278-281
  • Journal article (peer-reviewed)
Abstract Subject headings
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  • Nanostructured phosphorous-alloyed Bi2Te3 thick films have been prepared by electrochemical deposition. The average grain size of the films was calculated to be 14-26nm based on Scherrer's equation. The effect of P on the Seebeck coefficient of the Bi2Te3 thick film was investigated. The results show that P-alloyed thick film has n-type conductivity with the Seebeck coefficient of -35 mu V/K. The correlation between P site occupancy in the crystal and the Seebeck coefficient was discussed.

Keyword

Thermoelectric materials
Microstructure
Seebeck microprobe
thermoelectric-materials
single-crystals
bi2te3
defects

Publication and Content Type

ref (subject category)
art (subject category)

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