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Electrical characte...
Electrical characterization of integrated 2-input TTL NAND Gate at elevated temperature, fabricated in bipolar SiC-technology
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- Shakir, Muhammad (författare)
- KTH,Integrerade komponenter och kretsar
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- Elahipanah, Hossein (författare)
- KTH
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- Hedayati, Raheleh (författare)
- KTH
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- Zetterling, Carl-Mikael, 1966- (författare)
- KTH,Integrerade komponenter och kretsar
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(creator_code:org_t)
- Trans Tech Publications Inc. 2018
- 2018
- Engelska.
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Ingår i: International Conference on Silicon Carbide and Related Materials, ICSCRM 2017. - : Trans Tech Publications Inc.. - 9783035711455 ; , s. 958-961
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.4...
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Abstract
Ämnesord
Stäng
- This work presents the design and electrical characterization of in-house-fabricated 2-input NAND gate. The monolithic bipolar 2-input NAND gate employing transistor-transistor logic (TTL) is demonstrated in 4H-SiC and operates over a wide range of temperature and supply voltage. The fabricated circuit was characterized on the wafer by using a hot-chuck probe-station from 25 °C up to 500 °C. The circuit is also characterized over a wide range of voltage supply i.e. 11 to 20 V. The output-noise margin high (NMH) and output-noise margin low (NML) are also measured over a wide range of temperatures and supply voltages using voltage transfer characteristics (VTC). The transient response was measured by applying two square waves of, 5 kHz and 10 kHz. It is demonstrated that the dynamic parameters of the circuit are temperature dependent. The 2-input TTL NAND gate consumes 20 mW at 500 °C and 15 V.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- Bipolar junction transistor (BJT)
- Bipolar SiC NAND gate
- Digital gate
- High temperature integrated circuits (ICs)
- SiC ICs
- Transistor-transistor logic (TTL)
- TTL NAND gate
Publikations- och innehållstyp
- ref (ämneskategori)
- kon (ämneskategori)
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