Comments on a peak of AlxGa1-xN observed by infrared reflectance

• AlxGa1-xN epilayers, grown on c-plane oriented sapphire substrates by metal organic chemical vapour deposition (MOCVD), were evaluated using FTIR infrared reflectance spectroscopy. A peak at similar to 850 cm(-1) in the reflectance spectra, not reported before, was observed. Possible origins for this peak are considered and discussed. (C) 2016 Elsevier B.V. All rights reserved.

Ämnesord

NATURVETENSKAP  -- Fysik -- Den kondenserade materiens fysik (hsv//swe)

NATURAL SCIENCES  -- Physical Sciences -- Condensed Matter Physics (hsv//eng)

Nyckelord

AlxGa1-xN; Infrared reflectance; Unassigned peak origin

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ref (ämneskategori)

art (ämneskategori)