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Estimating depolari...
Estimating depolarization with the Jones matrix quality factor
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- Hilfiker, James N. (författare)
- JA Woollam Co Inc, NE 68508 USA
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- Hale, Jeffrey S. (författare)
- JA Woollam Co Inc, NE 68508 USA
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- Herzinger, Craig M. (författare)
- JA Woollam Co Inc, NE 68508 USA
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- Tiwald, Tom (författare)
- JA Woollam Co Inc, NE 68508 USA
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- Hong, Nina (författare)
- JA Woollam Co Inc, NE 68508 USA
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- Schoche, Stefan (författare)
- JA Woollam Co Inc, NE 68508 USA
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- Arwin, Hans (författare)
- Linköpings universitet,Tunnfilmsfysik,Tekniska fakulteten
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(creator_code:org_t)
- ELSEVIER SCIENCE BV, 2017
- 2017
- Engelska.
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Ingår i: Applied Surface Science. - : ELSEVIER SCIENCE BV. - 0169-4332 .- 1873-5584. ; 421, s. 494-499
- Relaterad länk:
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https://liu.diva-por... (primary) (Raw object)
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Mueller matrix (MM) measurements offer the ability to quantify the depolarization capability of a sample. Depolarization can be estimated using terms such as the depolarization index or the average degree of polarization. However, these calculations require measurement of the complete MM. We propose an alternate depolarization metric, termed the Jones matrix quality factor, QJM, which does not require the complete MM. This metric provides a measure of how close, in a least-squares sense, a Jones matrix can be found to the measured Mueller matrix. We demonstrate and compare the use of QJM to other traditional calculations of depolarization for both isotropic and anisotropic depolarizing samples; including nonuniform coatings, anisotropic crystal substrates, and beetle cuticles that exhibit both depolarization and circular diattenuation. (C) 2016 Elsevier B.V. All rights reserved.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Bearbetnings-, yt- och fogningsteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Manufacturing, Surface and Joining Technology (hsv//eng)
Nyckelord
- Depolarization; Spectroscopic ellipsometry; Mueller matrix; Mueller matrix ellipsometry; Jones matrix quality factor; Depolarization; Index; Thickness nonuniformity; Anisotropy
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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