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Thermal-induced int...
Thermal-induced interface degradation in perovskite light-emitting diodes
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- Zou, Yatao (författare)
- Linköpings universitet,Biomolekylär och Organisk Elektronik,Tekniska fakulteten,Soochow Univ, Peoples R China
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- Wu, Tian (författare)
- Soochow Univ, Peoples R China
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- Fu, Fan (författare)
- Empa Swiss Fed Labs Mat Sci & Technol, Switzerland
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- Bai, Sai (författare)
- Linköpings universitet,Biomolekylär och Organisk Elektronik,Tekniska fakulteten
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- Cai, Lei (författare)
- Soochow Univ, Peoples R China
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- Yuan, Zhongcheng (författare)
- Linköpings universitet,Biomolekylär och Organisk Elektronik,Tekniska fakulteten
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- Li, Yajuan (författare)
- Soochow Univ, Peoples R China
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- Li, Ruiying (författare)
- Soochow Univ, Peoples R China
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- Xu, Weidong (författare)
- Linköpings universitet,Biomolekylär och Organisk Elektronik,Tekniska fakulteten
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- Song, Tao (författare)
- Soochow Univ, Peoples R China
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- Yang, Yingguo (författare)
- Chinese Acad Sci, Peoples R China
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- Gao, Xingyu (författare)
- Chinese Acad Sci, Peoples R China
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- Gao, Feng (författare)
- Linköpings universitet,Biomolekylär och Organisk Elektronik,Tekniska fakulteten
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- Sun, Baoquan (författare)
- Soochow Univ, Peoples R China
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(creator_code:org_t)
- 2020
- 2020
- Engelska.
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Ingår i: Journal of Materials Chemistry C. - : ROYAL SOC CHEMISTRY. - 2050-7526 .- 2050-7534. ; 8:43, s. 15079-15085
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https://liu.diva-por... (primary) (Raw object)
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https://www.dora.lib...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Perovskite light-emitting diodes (PeLEDs) have experienced rapid improvements in device efficiency during the last several years. However, the operational instability of PeLEDs remains a key barrier hindering their practical applications. A fundamental understanding of the degradation mechanism is still lacking but will be important to seek ways to mitigate these unwanted processes. In this work, through comprehensive characterizations of the perovskite emitters and the interfacial contacts, we figure out that Joule heating induced interface degradation is one of the dominant factors affecting the operational stability of PeLEDs. We investigate the interfacial contacts of PeLEDs based on a commonly used device structure, with an organic electron transport layer of 1,3,5-tris(N-phenylbenzimiazole-2-yl)benzene (TPBi), and observe obvious photoluminescence quenching of the perovskite layer after device operation. Detailed characterizations of the interlayers and the interfacial contacts reveal that photoluminescence quenching is mainly due to the element inter-diffusion at the interface induced by the morphological evolution of the TPBi layers under Joule heating during the operation of PeLEDs. Our work provides direct insights into the degradation pathways and highlights the importance of exploring intrinsically stable interlayers as well as interfacial contacts beyond the state-of-the-art to further boost the operational stability of PeLEDs.
Ämnesord
- NATURVETENSKAP -- Kemi -- Materialkemi (hsv//swe)
- NATURAL SCIENCES -- Chemical Sciences -- Materials Chemistry (hsv//eng)
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- art (ämneskategori)
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Zou, Yatao
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Wu, Tian
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Fu, Fan
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Bai, Sai
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Cai, Lei
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Yuan, Zhongcheng
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visa fler...
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Li, Yajuan
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Li, Ruiying
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Xu, Weidong
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Song, Tao
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Yang, Yingguo
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Gao, Xingyu
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Gao, Feng
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Sun, Baoquan
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visa färre...
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Linköpings universitet