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Atomic force micros...
Atomic force microscope current-imaging study for current density through nanocrystalline silicon dots embedded in SiO2
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- Salem, MA (författare)
- Tokyo Institute of Technolog
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- Mizuta, H (författare)
- Tokyo Institute of Technolog
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- Oda, S (författare)
- Tokyo Institute of Technolog
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- Fu, Y (författare)
- Gothenburg University,Göteborgs universitet,Institutionen för fysik (GU),Department of Physics (GU),University of Goteborg and Chalmers University of Technology
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- Willander, Magnus (författare)
- Gothenburg University,Göteborgs universitet,Institutionen för fysik (GU),Department of Physics (GU),University of Goteborg and Chalmers University of Technology
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(creator_code:org_t)
- Japan Society of Applied Physics / Japanese Journal of Applied Physics; 1999, 2005
- 2005
- Engelska.
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Ingår i: Japanese Journal of Applied Physics. - : Japan Society of Applied Physics / Japanese Journal of Applied Physics; 1999. - 0021-4922 .- 1347-4065. ; 44:07-Jan, s. L88-L91
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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https://gup.ub.gu.se...
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Abstract
Ämnesord
Stäng
- Simultaneous surface and current imaging through nanocrystalline silicon (nc-Si) dots embedded in SiO2 was achieved using a contact mode atomic force microscope (AFM) under a tip-to-sample bias voltages of about 5 V. The obtained images were then analyzed using a one-dimensional model of current density, which took account of the spherical shape of the nc-Si dots, the substrate orientation and the sample bias. A comparison between the experimental and theoretical results showed a fair agreement when the current pass through the dot center, although a large difference was found at a higher voltage. In addition, our model predicted tunneling current oscillations due to a change in tip position relative to the dot center.
Ämnesord
- NATURVETENSKAP -- Fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences (hsv//eng)
Nyckelord
- silicon quantum dot; atomic force microscope; current imaging; current density
- TECHNOLOGY
- TEKNIKVETENSKAP
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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