Sökning: onr:"swepub:oai:DiVA.org:liu-61314" >
On-Chip Stimulus Ge...
On-Chip Stimulus Generator for Gain, Linearity, and Blocking Profile Test of Wideband RF Front Ends
-
- Ramzan, Rashad (författare)
- Linköpings universitet,Institutionen för systemteknik,Tekniska högskolan
-
- Ahsan, Naveed (författare)
- Linköpings universitet,Institutionen för systemteknik,Tekniska högskolan
-
- Dabrowski, Jerzy (författare)
- Linköpings universitet,Elektroniska komponenter,Tekniska högskolan
-
(creator_code:org_t)
- IEEE Institute of Electrical and Electronics, 2010
- 2010
- Engelska.
-
Ingår i: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - : IEEE Institute of Electrical and Electronics. - 0018-9456. ; 59:11, s. 2870-2876
- Relaterad länk:
-
https://liu.diva-por... (primary) (Raw object)
-
visa fler...
-
https://urn.kb.se/re...
-
https://doi.org/10.1...
-
visa färre...
Abstract
Ämnesord
Stäng
- This paper presents the design and measurement of a stimulus generator suitable for on-chip RF test aimed at gain, 1-dB compression point (CP), and the blocking profile measurement. Implemented in a 90-nm complementary metal-oxide-semiconductor (CMOS), the generator consists of two low-noise voltage-controlled ring oscillators (VCOs) and an adder. It can generate a single-or two-tone signal in a range of 0.9-5.6 GHz with a tone spacing of 3 MHz to 4.5 GHz and adjustable output power. The VCOs are based on symmetrically loaded double-differential delay line architecture. The measured phase noise is -80 dBc/Hz at an offset frequency of 1 MHz for the oscillation frequency of 2.4 GHz. A single VCO consumes 26 mW at 1 GHz while providing -10-dBm power into a 50-Omega load. The silicon area of the complete test circuit including coupling capacitors is only 0.03 mm(2), while a single VCO occupies 0.012 mm(2). The measured gain, 1-dB CP, and blocking profile of the wideband receiver using the on-chip stimulus generator are within +/- 8%, +/- 10%, and +/- 18% of their actual values, respectively. These error values are acceptable for making a pass or fail decision during production testing.
Nyckelord
- On-chip RF testing
- RF design for testability (DfT)
- RF test
- stimulus generator
- voltage-controlled oscillator (VCO)
- TECHNOLOGY
- TEKNIKVETENSKAP
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
Hitta via bibliotek
Till lärosätets databas