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Dual-wavelength dig...
Dual-wavelength digital holography : single-shot shape evaluation using speckle displacements and regularization
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- Bergström, Per (författare)
- Luleå tekniska universitet,Matematiska vetenskaper,Luleå University of Technology
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- Khodadad, Davood, 1985- (författare)
- Luleå tekniska universitet,Strömningslära och experimentell mekanik,Luleå University of Technology
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- Hällstig, Emil (författare)
- Luleå tekniska universitet,Strömningslära och experimentell mekanik,Optronic Partner dp AB
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- Sjödahl, Mikael (författare)
- Luleå tekniska universitet,Strömningslära och experimentell mekanik,Luleå University of Technology
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(creator_code:org_t)
- Optical Society of America, 2014
- 2014
- Engelska.
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Ingår i: Applied Optics. - : Optical Society of America. - 1559-128X .- 2155-3165 .- 0003-6935 .- 1539-4522. ; 53:1, s. 123-131
- Relaterad länk:
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http://www.opticsinf...
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https://urn.kb.se/re...
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https://doi.org/10.1...
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https://urn.kb.se/re...
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https://urn.kb.se/re...
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https://urn.kb.se/re...
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Abstract
Ämnesord
Stäng
- This paper discusses the possibility of evaluating the shape of a free-form object in comparison with its shape prescribed by a CAD model. Measurements are made based on a single-shot recording using dual-wavelength holography with a synthetic wavelength of 1.4 mm. Each hologram is numerically propagated to different focus planes and correlated. The result is a vector field of speckle displacements that is linearly dependent on the local distance between the measured surface and the focus plane. From these speckle displacements, a gradient field of the measured surface is extracted through a proportional relationship. The gradient field obtained from the measurement is then aligned to the shape of the CAD model using the iterative closest point (ICP) algorithm and regularization. Deviations between the measured shape and the CAD model are found from the phase difference field, giving a high precision shape evaluation. The phase differences and the CAD model are also used to find a representation of the measured shape. The standard deviation of the measured shape relative the CAD model varies between 7 and 19 μm, depending on the slope.
Ämnesord
- NATURVETENSKAP -- Fysik -- Atom- och molekylfysik och optik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Atom and Molecular Physics and Optics (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
- NATURVETENSKAP -- Matematik -- Beräkningsmatematik (hsv//swe)
- NATURAL SCIENCES -- Mathematics -- Computational Mathematics (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Maskinteknik -- Teknisk mekanik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Mechanical Engineering -- Applied Mechanics (hsv//eng)
- TEKNIK OCH TEKNOLOGIER -- Maskinteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Mechanical Engineering (hsv//eng)
Nyckelord
- Inverse problems
- Surface measurements
- Digital holography
- Image recognition algorithms and filters
- Phase unwrapping
- Digital holographic imaging
- Diode lasers
- Holographic interferometry
- Laser speckle
- Light scattering
- Phase unwrapping
- Scientific Computing
- Experimentell mekanik
- Maskinteknik
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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