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Structural and chem...
Structural and chemical imaging analysis of bitumen
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- Lu, Xiaohu (författare)
- Nynas AB, Sweden
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- Sjövall, Peter (författare)
- RISE,Kemi och material
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- Soenen, Hilde (författare)
- Nynas NV, Belgium
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- Blom, Johan (författare)
- Antwerp University, Belgium
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- Andersson, Martin (författare)
- RISE,Yta, process och formulering
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(creator_code:org_t)
- 2019-09-03
- 2021
- Engelska.
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Ingår i: International Journal on Road Materials and Pavement Design. - : Taylor and Francis Ltd.. - 1468-0629 .- 2164-7402. ; 22:4, s. 852-870
- Relaterad länk:
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Microstructures of bitumen surfaces (both air-cooled and fractured) were imaged by atomic force microscopy (AFM) and chemically characterised by time-of-flight secondary ion mass spectrometry (TOF-SIMS). For certain air-cooled bitumen surfaces, bee structures were observed by AFM, and chemical explanation by wax crystallisation was confirmed by TOF-SIMS analysis. Unlike the air-cooled surfaces, the fracture surfaces generally did not show clear structure patterns. Furthermore, TOF-SIMS analysis was conducted on the tube-like or worm structures which were generated by environmental scanning electron microscopy (ESEM) on the bitumen surfaces. In general, very small chemical differences were observed between the structured and unstructured areas, as well as between different areas of the structure. To understand the formation of the ESEM structures, possible contributing factors were examined, from which a mechanism involving electron-induced heating was proposed.
Nyckelord
- AFM
- bitumen
- ESEM
- microstructure
- TOF-SIMS
- wax
- Atomic force microscopy
- Bituminous materials
- Cooling systems
- Organic polymers
- Scanning electron microscopy
- Secondary ion mass spectrometry
- Waxes
- Contributing factor
- Environmental scanning electron microscopies (ESEM)
- Fracture surfaces
- Time of flight secondary ion mass spectrometry
- ToF SIMS
- TOF-SIMS analysis
- Chemical analysis
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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