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Effect of Si on the...
Effect of Si on the hydrogen-based direct reduction of Fe2O3 studied by XPS of sputter-deposited thin-film model systems
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- Patterer, Lena (författare)
- Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany.
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- Mayer, Eva B. (författare)
- Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany.
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- Mraz, Stanislav (författare)
- Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany.
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- Pöllmann, Peter J. (författare)
- Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany.
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- Hans, Marcus (författare)
- Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany.
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- Primetzhofer, Daniel (författare)
- Uppsala universitet,Tillämpad kärnfysik
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- Souza Filho, Isnaldi R. (författare)
- Max Planck Inst Eisenforsch GmbH, Max Planck Str 1, D-40237 Dusseldorf, Germany.
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- Springer, Hauke J. (författare)
- Max Planck Inst Eisenforsch GmbH, Max Planck Str 1, D-40237 Dusseldorf, Germany.;Rhein Westfal TH Aachen, Inst Met Forming, Intzestr 10, D-52072 Aachen, Germany.
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- Schneider, Jochen M. (författare)
- Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany.
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Rhein Westfal TH Aachen, Mat Chem, Kopernikusstr 10, D-52074 Aachen, Germany Tillämpad kärnfysik (creator_code:org_t)
- Elsevier, 2023
- 2023
- Engelska.
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Ingår i: Scripta Materialia. - : Elsevier. - 1359-6462 .- 1872-8456. ; 233
- Relaterad länk:
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https://uu.diva-port... (primary) (Raw object)
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https://urn.kb.se/re...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- Understanding the effect of gangue elements is of critical importance to optimize the efficiency of hydrogen -based direct reduction (HyDR) of iron ore, as one of the key steps towards climate-neutral steel production. Here, we demonstrate on the example of Si-doped Fe2O3, how thin films can be effectively utilized as a model system to facilitate systematic investigation of the solid-state reduction behavior. In-vacuo X-ray photoelectron spectroscopy (XPS) is used to probe the reduction kinetics by analyzing the chemical state of iron oxide thin films before and after annealing at 700 degrees C in an Ar+5%H2 atmosphere. It is demonstrated that even low Si concen-trations of 3.7 at.% inhibit the HyDR of Fe2O3 by the formation of a SiOx-enriched reduction barrier in the surface-near region.
Ämnesord
- NATURVETENSKAP -- Fysik -- Den kondenserade materiens fysik (hsv//swe)
- NATURAL SCIENCES -- Physical Sciences -- Condensed Matter Physics (hsv//eng)
Nyckelord
- Hydrogen
- X-ray photoelectron spectroscopy
- Direct reduction of iron oxide
- Silicon
- Thin films
Publikations- och innehållstyp
- ref (ämneskategori)
- art (ämneskategori)
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