Sökning: onr:"swepub:oai:lup.lub.lu.se:a65cdd64-b1d6-48f3-982a-dcb9e9c0a7b4" >
Detection of sub-pi...
Detection of sub-pixel fractures in X-ray dark-field tomography
-
Lauridsen, Torsten (författare)
-
Willner, Marian (författare)
-
- Bech, Martin (författare)
- Lund University,Lunds universitet,Medicinsk strålningsfysik, Lund,Sektion V,Institutionen för kliniska vetenskaper, Lund,Medicinska fakulteten,Medical Radiation Physics, Lund,Section V,Department of Clinical Sciences, Lund,Faculty of Medicine
-
visa fler...
-
Pfeiffer, Franz (författare)
-
Feidenhans'l, Robert (författare)
-
visa färre...
-
(creator_code:org_t)
- 2015-09-23
- 2015
- Engelska.
-
Ingår i: Applied Physics A: Materials Science & Processing. - : Springer Science and Business Media LLC. - 1432-0630. ; 121:3, s. 1243-1250
- Relaterad länk:
-
http://dx.doi.org/10...
-
visa fler...
-
https://lup.lub.lu.s...
-
https://doi.org/10.1...
-
visa färre...
Abstract
Ämnesord
Stäng
- We present a new method for detecting fractures in solid materials below the resolution given by the detector pixel size by using grating-based X-ray interferometry. The technique is particularly useful for detecting sub-pixel cracks in large samples where the size of the sample is preventing high-resolution mu CT studies of the entire sample. The X-ray grating interferometer produces three distinct modality signals: absorption, phase and dark field. The method utilizes the unique scattering features of the dark-field signal. We have used tomograms reconstructed from each of the three signals to detect cracks in a model sample consisting of stearin.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Materialteknik -- Annan materialteknik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Materials Engineering -- Other Materials Engineering (hsv//eng)
Publikations- och innehållstyp
- art (ämneskategori)
- ref (ämneskategori)
Hitta via bibliotek
Till lärosätets databas