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ZrO2 and ZrO2/Y2O3 ...
ZrO2 and ZrO2/Y2O3 gate dielectrics prepared by evaporation and annealing processes
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- Johansson, Mikael (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Yousif, M. Y. A., 1963 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Sareen, Alok, 1972 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Lundgren, Per, 1968 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Bengtsson, Stefan, 1961 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Södervall, Ulf, 1954 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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(creator_code:org_t)
- 2002
- 2002
- Engelska.
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Ingår i: ASDAM '02. Conference Proceedings. Fourth International Conference on Advanced Semiconductor Devices and Microsystems. ; , s. 279-
- Relaterad länk:
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http://dx.doi.org/10...
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https://research.cha...
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https://doi.org/10.1...
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Abstract
Ämnesord
Stäng
- The electrical characteristics of MOS capacitors with ZrO2 gate dielectric prepared by e-beam evaporation of Zr or Yttrium Stabilized Zirconia (YSZ) and subsequent thermal treatment are reported. With this method dielectrics corresponding to an equivalent oxide thickness (EOT) of 1.9 nm and a relative dielectric constant of approximately 15 have been prepared. The effect of annealing on Zr incorporation into the Si substrate is investigated SIMS analysis showed no signs of Zr diffusion in the substrate at temperatures as high as 900°C and that significant diffusion from the dielectric layer occur only at 1100°C
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- mass spectroscopic chemical analysis
- secondary ion mass spectra
- electron beam deposition
- yttrium compounds
- MOS capacitors
- zirconium compounds
- annealing
- permittivity
- diffusion
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)