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Turbulence measurem...
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Löfdahl, Lennart,1948Chalmers tekniska högskola,Chalmers University of Technology
(författare)
Turbulence measurements using sensors based on silicon technology
- Artikel/kapitelEngelska1989
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LIBRIS-ID:oai:research.chalmers.se:4e6315d9-7ceb-4608-a474-29ad7739e513
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https://research.chalmers.se/publication/125269URI
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Språk:engelska
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Sammanfattning på:engelska
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Ämneskategori:kon swepub-publicationtype
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Ämneskategori:ref swepub-contenttype
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A small and highly flow velocity has been designed and fabricated using silicon microelectronic technology. To determine the performance of this silicon sensor were done on a well-defined two dimensional turbulent flat plate boundary layer at a constant Reynolds number of 4.2*106.The silicon sensor was found to have a spatial and frequency resolution that makes it suitable for turbulence measurements. In the investigated flow field the new silicon sensor measure profiles of the measure profiles of the mean velocity and the turbulence intensity with the same accuracy as the hot-wire.Based on these results, three new sensors configurations have been designed. These sensors are also presented and discussed.
Ämnesord och genrebeteckningar
Biuppslag (personer, institutioner, konferenser, titlar ...)
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Stemme, Göran,1958
(författare)
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Johansson, Bert,1941Chalmers tekniska högskola,Chalmers University of Technology
(författare)
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Chalmers tekniska högskola
(creator_code:org_t)
Sammanhörande titlar
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Ingår i:ICIASF ’89, Deutsche Forschungsanstalt für Luft und Raumfahrt, Research Center Göttingen,W.-Germany, September 18-21, s. 95 - 103
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