Sökning: onr:"swepub:oai:research.chalmers.se:8cc6fd37-f9d0-45ef-883c-43c275d5bc4c" >
A novel technique f...
A novel technique for the extraction of nonlinear model for microwave transistors under dynamic-bias operation
-
- Avolio, G. (författare)
- Katholieke Universiteit Leuven
-
- Raffo, A. (författare)
- University of Ferrara
-
- Angelov, Iltcho, 1943 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
-
visa fler...
-
- Crupi, G. (författare)
- Universita degli Studi di Messina,University of Messina
-
- Vannini, G. (författare)
- University of Ferrara
-
- Schreurs, Dmmp (författare)
- Katholieke Universiteit Leuven
-
visa färre...
-
(creator_code:org_t)
- ISBN 9781467361767
- 2013
- 2013
- Engelska.
-
Ingår i: IEEE MTT-S International Microwave Symposium Digest. - 0149-645X. - 9781467361767 ; , s. Art. no. 6697394-
- Relaterad länk:
-
https://doi.org/10.1...
-
visa fler...
-
https://research.cha...
-
visa färre...
Abstract
Ämnesord
Stäng
- In this work we describe a novel technique for the extraction of nonlinear model for microwave transistors from nonlinear measurements obtained by simultaneously driving the device under test with low- and high-frequency excitations. Specifically, the large-signal operating point of the device is set by large-signal low-frequency excitations. On top of these a tickle tone at high-frequency is applied. In this way, one can separate the contributions of the IDS current source and the charge sources by a single measurement. The nonlinear model, based on equations available in commercial CAD tools, is extracted for a 0.15 μm GaAs pHEMT. Good agreement is obtained between model predictions and experimental data.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- Microwave FET
- Q-V characteristics
- I-V dynamic characteristics
- Nonlinear transistor model
- Nonlinear measurements
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)
Hitta via bibliotek
Till lärosätets databas