Sökning: onr:"swepub:oai:research.chalmers.se:c7caf3ff-ff69-4071-a3fa-315483ce7633" >
Bonded Al2O3-covere...
Bonded Al2O3-covered Si-wafers for highly thermally conductive SOI-materials
-
- Ericsson, Per, 1968 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
-
- Bengtsson, Stefan, 1961 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
-
Skarp, Jarmo (författare)
-
visa fler...
-
Kanniainen, T. (författare)
-
visa färre...
-
(creator_code:org_t)
- 1998
- 1998
- Engelska.
-
Ingår i: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding: Science, Technology, and Applications. ; , s. 576-
- Relaterad länk:
-
https://research.cha...
Abstract
Ämnesord
Stäng
- Aluminum oxide films deposited by low temperature atomic layer epitaxy were studied as an alternative to the commonly used silicon dioxide buried insulator of bonded silicon on insulator wafers. Successful room temperature bonding was performed between bare hydrophilic silicon wafers and silicon wafers covered with aluminum oxide. The surface energy after room temperature bonding was 50 mJ/m2, and after an anneal at 330°C, it had increased to 600 mJ/m2. After annealing at 500°C, the silicon wafers fractured upon insertion of a 50 μm blade. Higher temperatures than 500°C resulted in wafer separation, probably due to film densification and associated tensile stress. Leakage currents through the aluminum oxide films and breakdown electric fields were satisfactory for the intended application after a post-deposition anneal
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik -- Annan elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering -- Other Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- surface energy
- densification
- wafer bonding
- buried layers
- aluminium compounds
- silicon-on-insulator
- fracture
- atomic layer epitaxial growth
- annealing
- electric breakdown
- internal stresses
- dielectric thin films
- thermal conductivity
- leakage currents
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)