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RF characterization...
RF characterization of cold-electron bolometer integrated with a unilateral finline
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- Otto, Ernst, 1971 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Grimes, P. K. (författare)
- University Of Oxford,Smithsonian Astrophysical Observatory
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- Yassin, G. (författare)
- University Of Oxford
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visa fler...
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- Tarasov, Mikhail, 1954 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Kuzmin, Leonid, 1946 (författare)
- Chalmers tekniska högskola,Chalmers University of Technology
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- Withington, S. (författare)
- University Of Cambridge
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visa färre...
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(creator_code:org_t)
- ISBN 9780819491534
- 2012
- 2012
- Engelska.
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Ingår i: Proceedings of SPIE - The International Society for Optical Engineering. - 0277-786X .- 1996-756X. - 9780819491534 ; 8452, s. Art. no. 84521X-
- Relaterad länk:
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https://research.cha...
Abstract
Ämnesord
Stäng
- The Cold-Electron Bolometer (CEB) is a very sensitive millimetre-wave detector with high saturation power, fast response and is easy to integrate with planar circuits. We have designed, fabricated and tested CEB detectors integrated across the slot of a unilateral finline on silicon substrate. Bolometers were fabricated using e-beam direct-write trilayer technology. The CEB performance was tested in a He3 sorption cryostat HELIOX-AC-V at a bath temperature of 310 mK. DC IV curves were measured in a current bias mode and optical response was measured by irradiating samples with signals from a black body source mounted inside the cryostat. The finline chip with CEB device was mounted in a waveguide block and connected to the readout system by bond-wires. The RF signal was focused onto the waveguide input using a horn. The signal response was obtained by comparing different IV curves in current-biased mode at different temperatures of the RF source. The response measured as a voltage difference between the IV curves taken at the source temperatures of 5 K and 20 K was about 155 μV.
Ämnesord
- TEKNIK OCH TEKNOLOGIER -- Elektroteknik och elektronik (hsv//swe)
- ENGINEERING AND TECHNOLOGY -- Electrical Engineering, Electronic Engineering, Information Engineering (hsv//eng)
Nyckelord
- RF testing
- Millimeter-wave detectors
- Nanodevices
- e-beam lithography
- Nanotechnology
Publikations- och innehållstyp
- kon (ämneskategori)
- ref (ämneskategori)
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