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  • Fröjdh, Erik, 1984-, et al. (author)
  • Mapping the x-ray response of a CdTe sensor with small pixels using an x-ray microbeam and a single photon processing readout chip
  • 2011
  • In: Proceedings of SPIE - The International Society for Optical Engineering. - : SPIE - International Society for Optical Engineering. - 9780819487520 ; , s. Art. no. 814208-
  • Conference paper (peer-reviewed)abstract
    • CdTe is a promising material for X-ray imaging since it has high stopping power for X-rays. However defects in the material, non ideal charge transport and long range X-ray fluorescence deteriorates the image quality. We have investigated the response of a CdTe sensor with very small pixels using an X-ray microbeam entering the sensor at a small incident angle. Effects of defects as well as depth of interaction can be measured by this method. Both electron and hole collection mode has been tested. The results show distorted electrical field around defects in the material and also shows the small pixel effect. It is also shown that charge summing can be used to get correct spectral information.
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  • Result 1-1 of 1
Type of publication
conference paper (1)
Type of content
peer-reviewed (1)
Author/Editor
Fröjdh, Christer (1)
Thungström, Göran (1)
Norlin, Börje (1)
Fröjdh, Erik, 1984- (1)
University
Mid Sweden University (1)
Language
English (1)
Research subject (UKÄ/SCB)
Natural sciences (1)
Engineering and Technology (1)
Year
2011 (1)

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