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Search: WFRF:(Aldushin K.)

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  • Moeck, P., et al. (author)
  • Nominal PbSe nano-islands on PbTe : Grown by MBE, analyzed by AFM and TEM
  • 2005
  • Conference paper (peer-reviewed)abstract
    • Nominal PbSe nano-islands were grown in the Stranski-Krustanow mode on (111) oriented PbTe/BaF 2 pseudo-substrates by molecular beam epitaxy (MBE). The number density and morphology of these islands were assessed by means of atomic force microscopy (AFM). Transmission electron microscopy (TEM) was employed to determine the strain state and cryslallographic structure of these islands. On the basis of both AFM and TEM analyses, we distinguish between different groups of tensibly strained islands. The suggestion is made to use such nano-islands as part of nanometrology standards for scanning probe microscopy.
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  • Result 1-1 of 1
Type of publication
conference paper (1)
Type of content
peer-reviewed (1)
Author/Editor
Lee, J. (1)
Kapilashrami, Mukes (1)
Rao, Arvind (1)
Morris, J. E. (1)
Moeck, P. (1)
Aldushin, K. (1)
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Browning, N. D. (1)
McCann, P. J. (1)
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University
Royal Institute of Technology (1)
Language
English (1)
Research subject (UKÄ/SCB)
Engineering and Technology (1)
Year
2005 (1)

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