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  • 2021
  • swepub:Mat__t
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2.
  • Reimers, Sonka, et al. (author)
  • Defect-driven antiferromagnetic domain walls in CuMnAs films
  • 2022
  • In: Nature Communications. - : Springer Science and Business Media LLC. - 2041-1723. ; 13:1
  • Journal article (peer-reviewed)abstract
    • Efficient manipulation of antiferromagnetic (AF) domains and domain walls has opened up new avenues of research towards ultrafast, high-density spintronic devices. AF domain structures are known to be sensitive to magnetoelastic effects, but the microscopic interplay of crystalline defects, strain and magnetic ordering remains largely unknown. Here, we reveal, using photoemission electron microscopy combined with scanning X-ray diffraction imaging and micromagnetic simulations, that the AF domain structure in CuMnAs thin films is dominated by nanoscale structural twin defects. We demonstrate that microtwin defects, which develop across the entire thickness of the film and terminate on the surface as characteristic lines, determine the location and orientation of 180∘ and 90∘ domain walls. The results emphasize the crucial role of nanoscale crystalline defects in determining the AF domains and domain walls, and provide a route to optimizing device performance.
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3.
  • Reimers, Sonka, et al. (author)
  • Defect-driven antiferromagnetic domain walls in CuMnAs films
  • 2023
  • In: 2023 IEEE International Magnetic Conference - Short Papers, INTERMAG Short Papers 2023 - Proceedings. - 9798350338362
  • Conference paper (peer-reviewed)abstract
    • Antiferromagnetic (AF) materials offer a route to realising high-speed, high-density data storage devices that are robust against magnetic fields due to their intrinsic dynamics in the THz-regime and the lack magnetic stray fields. The key to functionality and efficiency is the control of AF domains and domain walls. Although AF domain structures are known to be sensitive to magnetoelastic effects, the microscopic interplay of crystalline defects, strain and magnetic ordering remains largely unknown. Here, we reveal, using photoemission electron microscopy combined with scanning x-ray diffraction microscopy and micromagnetic simulations, that the AF domain structure in CuMnAs thin films is dominated by nanoscale structural twin defects, which determine the location and orientation of 180° and 90° domain walls. The results emphasise the high sensitivity of the AF domain structure to the crystallographic nanostructure and provide a route to optimisng device performance.
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conference paper (1)
journal article (1)
Type of content
peer-reviewed (2)
Author/Editor
Liu, X (1)
Chen, L (1)
Chen, S. (1)
Clark, A. (1)
Francis, D. (1)
George, S. (1)
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Gupta, S. (1)
Huang, Y. (1)
King, M. (1)
Lee, L. (1)
Lewis, A. (1)
Li, L. (1)
Liu, B. (1)
Lopes, L. (1)
Losada, M. (1)
Mann, A. (1)
Mehta, A. (1)
Moss, J. (1)
Negri, G. (1)
Robson, A. (1)
Romano, M. (1)
Thomson, E. (1)
Wang, H. (1)
Webb, S. (1)
Wu, M. (1)
Yang, Y. (1)
Zhang, H. (1)
Zhao, Z. (1)
Morton, A. (1)
Aoun, S. (1)
Brown, G. (1)
Patel, N. (1)
Taylor, C. (1)
Davies, E. (1)
Haider, S. (1)
Gupta, A. (1)
Kelly, M. (1)
Li, J. (1)
Coe, P. (1)
Smith, M. (1)
Zhang, G (1)
Pal, A. (1)
Shaw, C. (1)
Allen, K. (1)
Price, S (1)
Martin, J. (1)
Thomas, P. (1)
Davies, G (1)
Schulz, J (1)
Aytac, E (1)
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University
Lund University (2)
Karolinska Institutet (1)
Language
English (3)
Research subject (UKÄ/SCB)
Natural sciences (2)

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