| 1. |
- Jacobsson, Daniel, et al.
(author)
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Particle-assisted GaxIn1-xP nanowire growth for designed bandgap structures
- 2012
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In: Nanotechnology. - : IOP Publishing. - 0957-4484 .- 1361-6528. ; 23:24
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Journal article (peer-reviewed)abstract
- Non-tapered vertically straight GaxIn1-xP nanowires were grown in a compositional range from Ga0.2In0.8P to pure GaP in particle-assisted mode by controlling the trimethylindium, trimethylgallium and hydrogen chloride flows in metal-organic vapor phase epitaxy. X-ray energy dispersive spectroscopy in transmission electron microscopy revealed homogeneous radial material composition in single nanowires, whereas variations in the material composition were found along the nanowires. High-resolution x-ray diffraction indicates a variation of the material composition on the order of about 19% measuring an entire sample area, i.e., including edge effects during growth. The non-capped nanowires emit room temperature photoluminescence strongly in the energy range of 1.43-2.16 eV, correlated with the bandgap expected from the material composition.
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| 2. |
- Kriegner, D., et al.
(author)
-
Structural investigation of GaInP nanowires using X-ray diffraction
- 2013
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In: Thin Solid Films. - : Elsevier BV. - 0040-6090. ; 543, s. 100-105
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Journal article (peer-reviewed)abstract
- In this work the structure of ternary GaxIn1-xP nanowires is investigated with respect to the chemical composition and homogeneity. The nanowires were grown by metal-organic vapor-phase epitaxy. For the investigation of ensemble fluctuations on several lateral length scales, X-ray diffraction reciprocal space maps have been analyzed. The data reveal a complicated varying materials composition across the sample and in the nanowires on the order of 20%. The use of modern synchrotron sources, where beam-sizes in the order of several 10 mu m are available, enables us to investigate compositional gradients along the sample by recording diffraction patterns at different positions. In addition, compositional variations were found also within single nanowires in X-ray energy dispersive spectroscopy measurements. (C) 2013 Elsevier B.V. All rights reserved.
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