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Search: WFRF:(Fukata N.)

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  • Hourahine, B., et al. (author)
  • Evidence for H2* trapped by carbon impurities in silicon
  • 2001
  • In: Physica. B, Condensed matter. - 0921-4526 .- 1873-2135. ; 308, s. 197-201
  • Journal article (peer-reviewed)abstract
    • Local mode spectroscopy and ab initio modelling are used to investigate two trigonal defects found in carbon-rich Si into which H had been in-diffused. Isotopic shifts with D and 13C are reported along with the effect of uniaxial stress. Ab initio modelling studies suggest that the two defects are two forms of the CH2* complex where one of the two hydrogen atoms lies at an anti-bonding site attached to C or Si, respectively. The two structures are nearly degenerate and possess vibrational modes in good agreement with those observed.
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  • Result 1-1 of 1
Type of publication
journal article (1)
Type of content
peer-reviewed (1)
Author/Editor
Jones, R. (1)
Briddon, P. R. (1)
Öberg, Sven (1)
Hourahine, B. (1)
Hermansson, J. (1)
Newman, R.C. (1)
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Murin, L I (1)
Markevich, V.P. (1)
Lindström, J. L. (1)
Kleverman, M. (1)
Fukata, N. (1)
Suezawa, M. (1)
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University
Luleå University of Technology (1)
Language
English (1)
Research subject (UKÄ/SCB)
Natural sciences (1)
Year
2001 (1)

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