SwePub
Sök i SwePub databas

  Extended search

Träfflista för sökning "WFRF:(Kinnell Peter) "

Search: WFRF:(Kinnell Peter)

  • Result 1-1 of 1
Sort/group result
   
EnumerationReferenceCoverFind
1.
  • Schultheiss, Fredrik, et al. (author)
  • Influence of the minimum chip thickness on the obtained surface roughness during turning operations
  • 2014
  • In: Procedia CIRP. - : Elsevier BV. - 2212-8271. ; 13, s. 67-71
  • Conference paper (peer-reviewed)abstract
    • Considerable efforts have been put into analyzing the obtained surface roughness during turning operations. However, knowledge is still lacking on how to model the arithmetic mean surface roughness Ra through using a general model applicable for all workpiece materials and process parameters. Further, the influence of the minimum chip thickness on the obtained surface roughness needs to be clarified. This article presents a new model for predicting the Ra surface roughness during turning operations. The model is based on physical and empirical knowledge of the turning process and has been experimentally validated through turning Al-SiCp MMC, cast iron, conventional- and stainless steels, as well as Ti6Al4V. The obtained results show great potentials with an average error of 6.7% even though errors as large as 16.6% were obtained for some cases.
  •  
Skapa referenser, mejla, bekava och länka
  • Result 1-1 of 1
Type of publication
conference paper (1)
Type of content
peer-reviewed (1)
Author/Editor
Ståhl, Jan-Eric (1)
Bushlya, Volodymyr (1)
Zhou, Jinming (1)
Hägglund, Sören (1)
Axinte, Dragos (1)
Schultheiss, Fredrik (1)
show more...
Clare, Adam (1)
Kinnell, Peter (1)
show less...
University
Lund University (1)
Language
English (1)
Research subject (UKÄ/SCB)
Engineering and Technology (1)
Year
2014 (1)

Kungliga biblioteket hanterar dina personuppgifter i enlighet med EU:s dataskyddsförordning (2018), GDPR. Läs mer om hur det funkar här.
Så här hanterar KB dina uppgifter vid användning av denna tjänst.

 
pil uppåt Close

Copy and save the link in order to return to this view