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  • Bertoni, M. I., et al. (author)
  • Nano-XRF and micro-Raman Studies of Metal Impurity Decoration around Dislocations in Multicrystalline Silicon
  • 2012
  • In: 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC). - New York, USA : IEEE. - 9781467300667 ; , s. 1613-1616
  • Conference paper (peer-reviewed)abstract
    • We push the resolution limits of synchrotron-based nano-X-ray fluorescence mapping below 100 nm to investigate the fundamental differences between benign and deleterious dislocations in multicystalline silicon solar cells. We observe that after processing recombination-active dislocations contain a high degree of nanoscale iron and copper decoration, while recombination-inactive dislocations appear clean. To study the origins of the distinct metal decorations around different dislocations we analyze as-grown samples as well as specimens at different stages of processing. We complement our X-ray studies with micro-Raman mapping to understand the relationship between metallic decoration and stress fields around dislocations.
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Type of publication
conference paper (1)
Type of content
peer-reviewed (1)
Author/Editor
Bertoni, M. I. (1)
Sarau, G. (1)
Fenning, D. P. (1)
Rinio, Markus (1)
Rose, V. (1)
Maser, J. (1)
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Buonassisi, T. (1)
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University
Karlstad University (1)
Language
English (1)
Research subject (UKÄ/SCB)
Natural sciences (1)
Year
2012 (1)

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