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Search: WFRF:(Sjolen J)

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1.
  • Flink, Axel, et al. (author)
  • Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy
  • 2009
  • In: WEAR. - : Elsevier BV. - 0043-1648. ; 266:11-12, s. 1237-1240
  • Journal article (peer-reviewed)abstract
    • A method based on focused ion beam milling and analytical electron microscopy to investigate the nature of the tool-chip interface is presented. It is employed to study tool-chip interfaces of the rake face of a (Ti0.83Si0.17)N coated PCBN insert after turning of case-hardened steel. Analytical electron microscopy shows the presence of a smeared adhered layer on the coating, which consists of steel elements from the work-piece, oxygen, and Si and N, most likely originating from the coating.
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2.
  • Khatibi, Ali, et al. (author)
  • Structural and mechanical properties of Cr-Al-O-N thin films grown by cathodic arc deposition
  • 2012
  • In: Acta Materialia. - : Elsevier. - 1359-6454 .- 1873-2453. ; 60:19, s. 6494-6507
  • Journal article (peer-reviewed)abstract
    • Coatings of (CrxAl1-x)(delta)(O1-yNy)(xi) with 0.33 less than= x less than= 0.96, 0 less than= y less than= 1 and 0.63 less than= delta/xi less than= 1.30 were deposited using cathodic arc evaporation in N-2/O-2 reactive gas mixtures on 50 V negatively biased WC-10 wt.% Co substrates from different Cr and Al alloys with three different Cr/Al compositional ratios. For N-2 less than 63% of the total gas, ternary (Cr,Al)(2)O-3 films containing less than1 at.% of N forms; as determined by elastic recoil detection analysis. Increasing the N-2 fraction to 75% and above results in formation of quaternary oxynitride films. Phase analyses of the films by X-ray diffraction, transmission electron microscopy and X-ray photoelectron spectroscopy show the predominance of cubic Cr-Al-N and cubic-(Cr,Al)(2)O-3 solid solutions and secondary hexagonal alpha-(Cr,Al)(2)O-3 solid solution. High Cr and Al contents result in films with higher roughness, while high N and O contents result in smoother surfaces. Nanoindentation hardness measurements showed that Al-rich oxide or nitride films have hardness values of 24-28 GPa, whereas the oxynitride films have a hardness of similar to 30 GPa, regardless of the Cr and Al contents. Metal cutting performance tests showed that the good wear properties are mainly correlated to the oxygen-rich coatings, regardless of the cubic or corundum fractions.
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3.
  • Zhu, Jianqiang, et al. (author)
  • Characterization of worn Ti-Si cathodes used for reactive cathodic arc evaporation
  • 2010
  • In: JOURNAL OF VACUUM SCIENCE and TECHNOLOGY A. - : American Vacuum Society. - 0734-2101. ; 28:2, s. 347-353
  • Journal article (peer-reviewed)abstract
    • The microstructural evolution of Ti1-xSix cathode surfaces (x=0, 0.1, 0.2) used in reactive cathodic arc evaporation has been investigated by analytical electron microscopy and x-ray diffractometry. The results show that the reactive arc operated in N-2 atmosphere induces a 2-12 mu m thick N-containing converted layer consisting of nanosized grains in the two-phase Ti and Ti5Si3 cathode surface. The formation mechanism of this layer is proposed to be surface nitriding and redeposition of macroparticles formed during the deposition process. The surface roughness of the worn Ti1-xSix cathodes increases with increasing Si content, up to 20 at. %, due to preferential erosion of Ti5Si3.
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