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Advances in RAMS Engineering : In Honor of Professor Ajit Kumar Verma on His 60th Birthday
- 2020
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Editorial collection (peer-reviewed)abstract
- This book surveys reliability, availability, maintainability and safety (RAMS) analyses of various engineering systems. It highlights their role throughout the lifecycle of engineering systems and explains how RAMS activities contribute to their efficient and economic design and operation.The book discusses a variety of examples and applications of RAMS analysis, including:• software products;• electrical and electronic engineering systems;• mechanical engineering systems;• nuclear power plants;• chemical and process plants and• railway systems.The wide-ranging nature of the applications discussed highlights the multidisciplinary nature of complex engineering systems. The book provides a quick reference to the latest advances and terminology in various engineering fields, assisting students and researchers in the areas of reliability, availability, maintainability, and safety engineering.
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- Thaduri, Adithya, et al.
(author)
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Failure modeling of constant fraction discriminator using physics of failure approach
- 2013
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In: International Journal of Reliability, Quality and Safety Engineering (IJRQSE). - 0218-5393. ; 20:3
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Journal article (peer-reviewed)abstract
- Due to several advancements in the technology trends in electronics, the reliability prediction by the constant failure methods and standards no longer provide accurate time to failure. The physics of failure methodology provides a detailed insight on the operation, failure point location and causes of failure for old, existing and newly developed components with consideration of failure mechanisms. Since safety is a major criteria for the nuclear industries, the failure modeling of advanced custom made critical components that exists on signal conditioning module are need to be studied with higher confidence. One of the components, constant fraction discriminator, is the critical part at which the failure phenomenon and modeling by regression is studied in this paper using physics of failure methodology.
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- Thaduri, Adithya, et al.
(author)
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Reliability prediction of optocouplers for the safety of digital instrumentation
- 2011
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In: 2011 IEEE International Conference on Quality and Reliability (ICQR). - Piscataway, NJ. - 9781457706264 - 9781457706288 ; , s. 491-495
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Conference paper (peer-reviewed)abstract
- Conventionally, reliability prediction of electronic components is carried out using standard handbooks such as MIL STD 217plus, Telecordia, etc. But these methods fail to provide a realistic estimate of reliability for upcoming technologies. Currently, electronic reliability prediction is moving towards applying the Physics of Failure approach which considers information on process, technology, fabrication techniques, materials used, etc. Industries employ different technologies like CMOS, BJT and BICMOS for various applications. The possibility of chance of failure at interdependencies of materials, processes, and characteristics under operating conditions is the major concern which affects the performance of the devices. They are characterized by several failure mechanisms at various stages such as wafer level, interconnection, etc. For this, the dominant failure mechanisms and stress parameters needs to be identified. Optocouplers are used in input protection of several instrumentation systems providing safety under over-stress conditions. Hence, there is a need to study the reliability and safety aspects of optocouplers. Design of experiments is an efficient and prominent methodology for finding the reliability of the item, as the experiment provides a proof for the hypothesis under consideration. One of the important techniques involved is Tagauchi method which employs for finding the prominent failure mechanisms in semiconductor devices. By physics of failure approach, the factors that are affecting the performance on both environmental and electrical parameters with stress levels for optocouplers are identified. By constructing a 2-stage tagauchi array with these parameters where output parameters decides the effect of top two dominant failure mechanisms and their extent of chance of failure can be predicted. This analysis helps us in making the appropriate modifications considering both the failure mechanisms for the reliability growth of these devices. Thi- - s paper highlights the application of design of experiments for finding the dominant failure mechanisms towards using physics of failure approach in electronic reliability prediction of optocouplers for application of instrumentation.
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- Thaduri, Adithya, et al.
(author)
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Reliability prediction of semiconductor devices using modified physics of failure approach
- 2013
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In: International Journal of Systems Assurance Engineering and Management. - : Springer Science and Business Media LLC. - 0975-6809 .- 0976-4348. ; 4:1, s. 33-47
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Journal article (peer-reviewed)abstract
- Traditional approaches like MIL-HDBK, Telcordia, and PRISM etc. have limitation in accurately predicting the reliability due to advancement in technology, process, materials etc. As predicting the reliability is the major concern in the field of electronics, physics of failure approach gained considerable importance as it involves investigating the root-cause which further helps in reliability growth by redesigning the structure, changing the parameters at manufacturer level and modifying the items at circuit level. On the other hand, probability and statistics methods provide quantitative data with reliability indices from testing by experimentation and by simulations. In this paper, qualitative data from PoF approach and quantitative data from the statistical analysis is combined to form a modified physics of failure approach. This methodology overcomes some of the challenges faced by PoF approach as it involves detailed analysis of stress factors, data modeling and prediction. A decision support system is added to this approach to choose the best option from different failure data models, failure mechanisms, failure criteria and other factors.
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- Thaduri, Adithya, et al.
(author)
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Stress factor and failure analysis of constant fraction discriminator using design of experiments
- 2013
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In: International Journal of Reliability, Quality and Safety Engineering (IJRQSE). - 0218-5393. ; 20:3
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Journal article (peer-reviewed)abstract
- Reliability prediction using traditional approaches were implemented at earlier stages of electronics. But due to advancements in science and technology, the above models are outdated. The alternative approach, physics of failure provides exhaustive information on basic failure phenomenon with failure mechanisms, failure modes and failure analysis becomes prominent because this method depends on factors like materials, processes, technology, etc., of the component. Constant fraction discriminators which is important component in NFMS needs to study failure characteristics and this paper provides this information on failure characteristics using physics of failure approach. Apart from that, the combined physics of failure approach with the statistical methods such as design of experiments, accelerated testing and failure distribution models to quantify time to failure of this electronic component by radiation and temperature as stress parameters. The SEM analysis of the component is carried out by decapsulating the samples and studied the impact of stress parameters on the device layout.
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- Thaduri, Adithya, et al.
(author)
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Study of reliability aspects in constant fraction discriminator
- 2011
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In: 5th International Conference on Quality, Reliability and Information Technology (ICQRIT). - Kathmandu. ; , s. 1-7
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Conference paper (peer-reviewed)abstract
- Reliability prediction using conventional constant failure models by standard books in early phases of electronics dominates wide acceptance. But after 1980s, there was wide variation in electronic technology which made above models obsolete. Physics of Failure approach provides information on basic failure phenomenon with failure mechanisms and failure modes becomes prominent as it entirely depends on materials, processes, technology etc. Constant fraction discriminators which are failing frequently in the field need to be studied and this paper provides information on failure characteristics using physics of failure approach. Apart from that, we combined statistical methods such as Design of Experiments, Accelerated testing and failure distribution models to quantify time to failure of this electronic component by radiation and temperature as stress parameters.
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