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| 2. |
- Persson, L., et al.
(author)
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Separation of mass-overlapped time of flight-energy elastic recoil detection analysis data using Ryan and Jamieson's dynamic analysis method
- 2001
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In: Nuclear Instruments and Methods in Physics Research Section B. - 0168-583X .- 1872-9584. ; 179:3, s. 403-411
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Journal article (peer-reviewed)abstract
- Time of flight-energy (ToF-E) elastic recoil detection analysis (ERDA) data often contains mass signals with considerable overlap from adjacent isotopes in the mass-energy plane. An evaluation has been carried out of the suitability of the dynamic analysis method proposed by Ryan and Jamieson to decompose elemental signals with overlapping mass. This method is shown to work very well on generated test data and the result when it was applied to experimental data appears quite promising. Very accurate mass calibration and lineshape determination was found to be a prerequisite for the application of the method.
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| 3. |
- Vockenhuber, C., et al.
(author)
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Energy loss and straggling of MeV Si ions in gases
- 2017
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In: Nuclear Instruments and Methods in Physics Research Section B. - : ELSEVIER SCIENCE BV. - 0168-583X .- 1872-9584. ; 391, s. 20-26
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Journal article (peer-reviewed)abstract
- We present measurements of energy loss and straggling of Si ions in gases. An energy range from 0.5 to 12 MeV/u was covered using the 6 MV EN tandem accelerator at ETH Zurich, Switzerland, and the K130 cyclotron accelerator facility at the University of Jyvaskyla, Finland. Our energy-loss data compare well with calculation based on the SRIM and PASS code. The new straggling measurements support a pronounced peak in He gas at around 4 MeV/u predicted by recent theoretical calculations. The straggling curve structure in the other gases (N-2, Ne, Ar, Kr) is relatively flat in the covered energy range. Although there is a general agreement between the straggling data and the theoretical calculations, the experimental uncertainties are too large to confirm or exclude the predicted weak multi-peak structure in the energy-loss straggling. (C) 2016 Elsevier B.V. All rights reserved.
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| 7. |
- Winzell, T., et al.
(author)
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Scanning mu-RBS characterisation of local loading effects of non-selectively epitaxially grown SiGe thin films
- 2001
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In: Nuclear Instruments and Methods in Physics Research Section B. - 0168-583X .- 1872-9584. ; 179:1, s. 121-125
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Journal article (peer-reviewed)abstract
- Scanning microbeam Rutherford backscattering spectrometry (mu -RBS) has been employed to investigate local loading effects of non-selective epitaxial growth (NSEG) of SiGe on Si in structures consisting of apertures in an SiO2 mask. The structure sizes were 22 mum x 22 mum. 42 mum x 42 mum, 82 mum x 82 mum and 500 mum x 2000 mum. From the measured thickness and Ge content, it was concluded that in NSEG local loading effects for the structure sizes used are small or absent.
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