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Enumeration	Reference	Cover	Find
1.	Ewert, Tony, et al. (author) Design and implementation of an ultra high precision parametric mismatch measurement system 2005 In: Proceedings ICMTS. ; , s. 149-154 Conference paper (peer-reviewed)
2.	Tuinhout, Hans, et al. (author) TCAD assisted evaluation of MOSFET fluctuation models Other publication (other academic/artistic)
3.	Wils, Nicole, et al. (author) Identification and analysis of a new BJT parametric mismatch phenomenon 2005 In: In Proceedings of the 2005 IEEE Bipolar/BiCMOS Circuits and Technology Meeting. ; , s. 224-227, s. 224-227 Journal article (peer-reviewed)

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Type of publication: other publication (1); conference paper (1); journal article (1)

Author/Editor: Tuinhout, Hans (3); Wils, Nicole (3); Olsson, Jörgen (2); Ewert, Tony (2); Kaiser, M (1); Berkum, J (1); show more...; Weemaes, R (1); show less...

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