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- Durr, Hermann A., et al.
(author)
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A Closer Look Into Magnetism : Opportunities With Synchrotron Radiation
- 2009
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In: IEEE transactions on magnetics. - 0018-9464 .- 1941-0069. ; 45:1, s. 15-57
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Research review (peer-reviewed)abstract
- The unique properties of synchrotron radiation, such as broad energy spectrum, variable light polarization, and flexible time structure, have made it an enormously powerful tool in the study of magnetic phenomena and materials. The refinement of experimental techniques has led to many new research opportunities, keeping up with the challenges put up by modern magnetism research. In this contribution, we review some of the recent developments in the application of synchrotron radiation and particularly soft X-rays to current problems in magnetism, and we discuss future perspectives.
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- Mertins, Hans-Christoph, et al.
(author)
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Detection of the Magnetocrystalline Anisotropy in X-Ray Magnetic Linear Dichroism Reflection Spectra Across the Fe 3p and 2p Edges
- 2014
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In: IEEE transactions on magnetics. - 0018-9464 .- 1941-0069. ; 50:11
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Journal article (peer-reviewed)abstract
- The magnetocrystalline anisotropy of X-ray magnetic linear dichroism (XMLD) reflection spectra measured on single-crystalline bcc Fe films across the 3p and 2p edges are presented. The XMLD spectra were obtained from a series of reflection spectra by aligning the electric field vector of linearly polarized undulator radiation with respect to the crystal axes. Our results show the presence of a huge magnetocrystalline anisotropy in the XMLD reflection spectra. The XMLD signal is further investigated as a function of the Fe film thickness in Au/Fe/Ag/GaAs layered systems. Simulations of the reflection spectra reveal the influences of interference effects, which can enhance or diminish the XMLD signals. The measured spectra are in good agreement with ab initio calculated spectra.
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| 13. |
- Schäfers, Franz, et al.
(author)
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Soft-x-ray polarimeter with multilayer optics : Complete analysis of the polarization state of light
- 1999
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In: Applied Optics. - 1559-128X. ; 38:19, s. 4074-4088
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Journal article (peer-reviewed)abstract
- The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18° has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV.
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