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1.	Galnander, B, et al. (author) Non-destructive chemical analysis of sandwich structures by means of soft X-ray emission 1999 In: THIN SOLID FILMS. - : ELSEVIER SCIENCE SA. - 0040-6090. ; 344, s. 35-38 Journal article (other academic/artistic)abstract Soft X-ray emission spectroscopy provides information about elemental composition, including the light elements, as well as the chemical bonding. The probe depth reaches hundreds of nanometers but under certain conditions considerable surface sensitivity

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Author/Editor: Guo, J. (1); NORDGREN, J (1); Nilsson, E (1); Blomquist, P (1); Rubensson, JE (1); Kaambre, T (1); show more...; Galnander, B (1); show less...

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