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Träfflista för sökning "WFRF:(Meneghini Matteo) "

Search: WFRF:(Meneghini Matteo)

  • Result 1-5 of 5
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2.
  • Gualtieri, Magdalena Lassinantti, et al. (author)
  • Crack formation in α-alumina supported MFI zeolite membranes studied by in situ high temperature synchrotron powder diffraction
  • 2007
  • In: Journal of Membrane Science. - : Elsevier BV. - 0376-7388 .- 1873-3123. ; 290:1-2, s. 95-104
  • Journal article (peer-reviewed)abstract
    • Cracks are frequently formed in α-alumina supported MFI membranes during calcination. To better understand crack formation, in situ powder diffraction data were collected during calcination of a type of MFI membrane (ca. 1800 nm thick) which is known to crack reproducibly. In addition, data for MFI powder and a blank support were also collected. Both a synchrotron radiation facility and an in-house instrument were used. The unit cell parameters were determined with the Rietveld method, and the strain in the direction perpendicular to the film surface was calculated for the film as well as for the support. The microstrain in the support was also estimated. Based on the results obtained here, a model for crack formation in this type of MFI membrane was proposed. The lack of cracks in other types of MFI membranes (ca. 500 nm) prepared in our laboratory is also explained by the model. In thicker MFI films, the crystals are well intergrown. During heating, the MFI crystals contract and the α-alumina support expands. Consequently, a thermal stress develops in the composite which eventually leads to formation of cracks in the film and structural defects in the support. In thinner films, the crystals are less well intergrown and the thermal expansion mismatch leads to opening of grain boundaries rather than cracks.
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3.
  • Kneissl, Michael, et al. (author)
  • Nitride Semiconductors
  • 2023
  • In: Physica Status Solidi (A) Applications and Materials Science. - : WILEY-V C H VERLAG GMBH. - 1862-6319 .- 1862-6300. ; 220:16
  • Journal article (other academic/artistic)
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4.
  • Kneissl, Michael, et al. (author)
  • Nitride Semiconductors
  • 2023
  • In: Physica Status Solidi (B): Basic Research. - : WILEY-V C H VERLAG GMBH. - 1521-3951 .- 0370-1972. ; 260:8
  • Journal article (other academic/artistic)
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5.
  • Zenari, M., et al. (author)
  • Modeling the Electrical Degradation of Micro-Transfer Printed 845 nm VCSILs for Silicon Photonics
  • 2024
  • In: IEEE Transactions on Electron Devices. - 1557-9646 .- 0018-9383. ; 71:2, s. 1131-1138
  • Journal article (peer-reviewed)abstract
    • This article deals for the first time with the electrical degradation of novel 845 nm vertical-cavity silicon-integrated lasers (VCSILs) for silicon photonics (SiPh). We analyzed the reliability of these devices by submitting them to high current stress. The experimental results showed that stress induced: 1) a significant increase in the series resistance, occurring in two separated time-windows and 2) a lowering of the turn-on voltage. To understand the origin of such degradation phenomena, we simulated the $\textit{I}$ - $\textit{V}$ characteristics and the band diagrams by a Poisson-drift-diffusion simulator. We demonstrated that the degradation was caused by the diffusion of mobile species capable of compensating the p-type doping. The diffusing species are expected to migrate from the p-contact region in the top distributed Bragg reflector (DBR) towards the active layers.
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  • Result 1-5 of 5
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journal article (5)
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peer-reviewed (3)
other academic/artistic (2)
Author/Editor
Haglund, Åsa, 1976 (2)
Zhang, Yan (1)
Korhonen, Laura (1)
Lindholm, Dan (1)
Vertessy, Beata G. (1)
Wang, Mei (1)
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Wang, Xin (1)
Liu, Yang (1)
Kumar, Rakesh (1)
Wang, Dong (1)
Li, Ke (1)
Liu, Ke (1)
Zhang, Yang (1)
Nàgy, Péter (1)
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De Milito, Angelo (1)
Zhang, Jian (1)
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Kågedal, Katarina (1)
Chen, Guoqiang (1)
Liu, Wei (1)
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Kumar, Ashok (1)
Simons, Matias (1)
Ishaq, Mohammad (1)
Andersson, Charlotte (1)
Yang, Qian (1)
Algül, Hana (1)
Brest, Patrick (1)
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