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1.
  • Bentham, James, et al. (author)
  • A century of trends in adult human height
  • 2016
  • In: eLIFE. - 2050-084X. ; 5
  • Journal article (peer-reviewed)abstract
    • Being taller is associated with enhanced longevity, and higher education and earnings. We reanalysed 1472 population-based studies, with measurement of height on more than 18.6 million participants to estimate mean height for people born between 1896 and 1996 in 200 countries. The largest gain in adult height over the past century has occurred in South Korean women and Iranian men, who became 20.2 cm (95% credible interval 17.522.7) and 16.5 cm (13.319.7) taller, respectively. In contrast, there was little change in adult height in some sub-Saharan African countries and in South Asia over the century of analysis. The tallest people over these 100 years are men born in the Netherlands in the last quarter of 20th century, whose average heights surpassed 182.5 cm, and the shortest were women born in Guatemala in 1896 (140.3 cm; 135.8144.8). The height differential between the tallest and shortest populations was 19-20 cm a century ago, and has remained the same for women and increased for men a century later despite substantial changes in the ranking of countries.
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2.
  • Bentham, James, et al. (author)
  • A century of trends in adult human height
  • 2016
  • In: eLIFE. - : eLife Sciences Publications Ltd. - 2050-084X. ; 5
  • Journal article (peer-reviewed)abstract
    • Being taller is associated with enhanced longevity, and higher education and earnings. We reanalysed 1472 population-based studies, with measurement of height on more than 18.6 million participants to estimate mean height for people born between 1896 and 1996 in 200 countries. The largest gain in adult height over the past century has occurred in South Korean women and Iranian men, who became 20.2 cm (95% credible interval 17.5–22.7) and 16.5 cm (13.3– 19.7) taller, respectively. In contrast, there was little change in adult height in some sub-Saharan African countries and in South Asia over the century of analysis. The tallest people over these 100 years are men born in the Netherlands in the last quarter of 20th century, whose average heights surpassed 182.5 cm, and the shortest were women born in Guatemala in 1896 (140.3 cm; 135.8– 144.8). The height differential between the tallest and shortest populations was 19-20 cm a century ago, and has remained the same for women and increased for men a century later despite substantial changes in the ranking of countries.
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3.
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4.
  • von Seidlein, Lorenz, et al. (author)
  • The impact of targeted malaria elimination with mass drug administrations on falciparum malaria in Southeast Asia: A cluster randomised trial
  • 2019
  • In: PLoS Medicine. - : PUBLIC LIBRARY SCIENCE. - 1549-1277 .- 1549-1676. ; 16:2
  • Journal article (peer-reviewed)abstract
    • Background The emergence and spread of multidrug-resistant Plasmodium falciparum in the Greater Mekong Subregion (GMS) threatens global malaria elimination efforts. Mass drug administration (MDA), the presumptive antimalarial treatment of an entire population to clear the subclinical parasite reservoir, is a strategy to accelerate malaria elimination. We report a cluster randomised trial to assess the effectiveness of dihydroartemisinin-piperaquine (DP) MDA in reducing falciparum malaria incidence and prevalence in 16 remote village populations in Myanmar, Vietnam, Cambodia, and the Lao Peoples Democratic Republic, where artemisinin resistance is prevalent. Methods and findings After establishing vector control and community-based case management and following intensive community engagement, we used restricted randomisation within village pairs to select 8 villages to receive early DP MDA and 8 villages as controls for 12 months, after which the control villages received deferred DP MDA. The MDA comprised 3 monthly rounds of 3 daily doses of DP and, except in Cambodia, a single low dose of primaquine. We conducted exhaustive cross-sectional surveys of the entire population of each village at quarterly intervals using ultrasensitive quantitative PCR to detect Plasmodium infections. The study was conducted between May 2013 and July 2017. The investigators randomised 16 villages that had a total of 8,445 residents at the start of the study. Of these 8,445 residents, 4,135 (49%) residents living in 8 villages, plus an additional 288 newcomers to the villages, were randomised to receive early MDA; 3,790 out of the 4,423 (86%) participated in at least 1 MDA round, and 2,520 out of the 4,423 (57%) participated in all 3 rounds. The primary outcome, P. falciparum prevalence by month 3 (M3), fell by 92% (from 5.1% [171/3,340] to 0.4% [12/2,828]) in early MDA villages and by 29% (from 7.2% [246/3,405] to 5.1% [155/3,057]) in control villages. Over the following 9 months, the P. falciparum prevalence increased to 3.3% (96/2,881) in early MDA villages and to 6.1% (128/2,101) in control villages (adjusted incidence rate ratio 0.41 [95% CI 0.20 to 0.84]; p = 0.015). Individual protection was proportional to the number of completed MDA rounds. Of 221 participants with subclinical P. falciparum infections who participated in MDA and could be followed up, 207 (94%) cleared their infections, including 9 of 10 with artemisinin-and piperaquine- resistant infections. The DP MDAs were well tolerated; 6 severe adverse events were detected during the follow-up period, but none was attributable to the intervention. Conclusions Added to community-based basic malaria control measures, 3 monthly rounds of DP MDA reduced the incidence and prevalence of falciparum malaria over a 1-year period in areas affected by artemisinin resistance. P. falciparum infections returned during the follow-up period as the remaining infections spread and malaria was reintroduced from surrounding areas. Limitations of this study include a relatively small sample of villages, heterogeneity between villages, and mobility of villagers that may have limited the impact of the intervention. These results suggest that, if used as part of a comprehensive, well-organised, and well-resourced elimination programme, DP MDA can be a useful additional tool to accelerate malaria elimination.
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5.
  • Zhou, Bin, et al. (author)
  • Worldwide trends in diabetes since 1980: A pooled analysis of 751 population-based studies with 4.4 million participants
  • 2016
  • In: The Lancet. - : Elsevier B.V.. - 0140-6736 .- 1474-547X. ; 387:10027, s. 1513-1530
  • Journal article (peer-reviewed)abstract
    • Background: One of the global targets for non-communicable diseases is to halt, by 2025, the rise in the age standardised adult prevalence of diabetes at its 2010 levels. We aimed to estimate worldwide trends in diabetes, how likely it is for countries to achieve the global target, and how changes in prevalence, together with population growth and ageing, are aff ecting the number of adults with diabetes.Methods: We pooled data from population-based studies that had collected data on diabetes through measurement of its biomarkers. We used a Bayesian hierarchical model to estimate trends in diabetes prevalence-defined as fasting plasma glucose of 7.0 mmol/L or higher, or history of diagnosis with diabetes, or use of insulin or oral hypoglycaemic drugs-in 200 countries and territories in 21 regions, by sex and from 1980 to 2014. We also calculated the posterior probability of meeting the global diabetes target if post-2000 trends continue.Findings: We used data from 751 studies including 4372000 adults from 146 of the 200 countries we make estimates for. Global age-standardised diabetes prevalence increased from 4.3% (95% credible interval 2.4-17.0) in 1980 to 9.0% (7.2-11.1) in 2014 in men, and from 5.0% (2.9-7.9) to 7.9% (6.4-9.7) in women. The number of adults with diabetes in the world increased from 108 million in 1980 to 422 million in 2014 (28.5% due to the rise in prevalence, 39.7% due to population growth and ageing, and 31.8% due to interaction of these two factors). Age-standardised adult diabetes prevalence in 2014 was lowest in northwestern Europe, and highest in Polynesia and Micronesia, at nearly 25%, followed by Melanesia and the Middle East and north Africa. Between 1980 and 2014 there was little change in age-standardised diabetes prevalence in adult women in continental western Europe, although crude prevalence rose because of ageing of the population. By contrast, age-standardised adult prevalence rose by 15 percentage points in men and women in Polynesia and Micronesia. In 2014, American Samoa had the highest national prevalence of diabetes (>30% in both sexes), with age-standardised adult prevalence also higher than 25% in some other islands in Polynesia and Micronesia. If post-2000 trends continue, the probability of meeting the global target of halting the rise in the prevalence of diabetes by 2025 at the 2010 level worldwide is lower than 1% for men and is 1% for women. Only nine countries for men and 29 countries for women, mostly in western Europe, have a 50% or higher probability of meeting the global target.Interpretation: Since 1980, age-standardised diabetes prevalence in adults has increased, or at best remained unchanged, in every country. Together with population growth and ageing, this rise has led to a near quadrupling of the number of adults with diabetes worldwide. The burden of diabetes, both in terms of prevalence and number of adults aff ected, has increased faster in low-income and middle-income countries than in high-income countries.
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6.
  • Jakobsen, Frida, et al. (author)
  • Urban livestock-keeping and dengue in urban and peri-urban Hanoi, Vietnam.
  • 2019
  • In: PLoS Neglected Tropical Diseases. - : Public Library of Science (PLoS). - 1935-2727 .- 1935-2735. ; 13:11
  • Journal article (peer-reviewed)abstract
    • Urban livestock provides an important source of food and income, but it may increase the risks for disease transmission. Vectors, such as mosquitoes, might increase and thereby cause an enhanced transmission of infectious diseases, such as dengue fever; considered the most important mosquito-borne viral disease globally. This cross-sectional study evaluated the awareness of dengue fever and investigated how the presence of dengue vectors is affected by the keeping of livestock in urban households in the city of Hanoi, Vietnam. From February to March 2018, during the season of lowest occurrence of dengue in Hanoi, 140 households were interviewed, of which 69 kept livestock. A general trend was observed; respondents living in the Dan Phuong district, a peri-urban district, had better knowledge and practice regarding dengue as compared to the urban Ha Dong district. In total, 3899 mosquitoes were collected and identified, of which 52 (1.33%) were Aedes species. A significant difference between the two districts was observed, with more households in Ha Dong having Aedes spp. mosquitoes (p = 0.02) and a higher incidence of dengue fever (p = 0.001). There was no significant association between livestock-rearing and the presence of Aedes spp. mosquitoes (p = 0.955), or between livestock-rearing and the incidence of dengue fever (p = 0.08). In conclusion, this study could not find any indication that households keeping livestock were at higher risk of dengue virus infections in Hanoi during the season of lowest occurrence of dengue, but clearly indicated the need of more information provided to urban inhabitants, particularly on personal protection.
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7.
  • Nguyen-Tien, Thang, et al. (author)
  • Knowledge and practice on prevention of mosquito-borne diseases in livestock-keeping and non-livestock-keeping communities in Hanoi city, Vietnam : A mixed-method study
  • 2021
  • In: PLOS ONE. - : Public Library of Science (PLoS). - 1932-6203. ; 16:2
  • Journal article (peer-reviewed)abstract
    • Mosquito-borne diseases (MBDs) are causing high morbidity and mortality for humans. Urban livestock keeping is still common in cities around the world. The animals may serve as reservoirs for zoonotic MBDs, which increase the risks for humans. Here we assess the knowledge and practices related to MBDs in households with livestock and without livestock and explore the perceptions of the health care sector about MBDs and livestock keeping in Hanoi city of Vietnam in a cross-sectional study. A quantitative survey was conducted including 513 households with and without livestock-keeping in six districts and complemented with qualitative surveys with four health staff from Hanoi Center of Disease Control and three district health centers. The quantitative survey indicated that the participants possessed basic knowledge on MBDs with an average score of 18.3 out of 35, of which non-livestock-keeping households had a better knowledge than households keeping livestock (p<0.05). Both household categories had low score, 3.5 out of 11, regarding preventive practices against MBDs. The negative binomial model showed that occupation and location of living were factors associated to the knowledge on MBDs. Farmers were likely to have better preventive practices as compared to office workers (p<0.05). Those who had better knowledge also had more adequate preventive practices against MBDs (p<0.001). The qualitative survey revealed that livestock keeping was determined as increasing risks of MBDs due to the increase of mosquito population. It is recommended that community campaigns to raise the awareness and change behavior on MBDs should be organized based on collaboration between the health sector and the veterinary sector for households with and without livestock living in central urban and peri-urban areas. Further studies are needed to confirm the association between urban livestock keeping and potential increasing risks of MBDs such as dengue and Japanese encephalitis.
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8.
  • Nguyen-Tien, Thang, et al. (author)
  • The Distribution and Composition of Vector Abundance in Hanoi City, Vietnam : Association with Livestock Keeping and Flavivirus Detection
  • 2021
  • In: Viruses. - : MDPI. - 1999-4915. ; 13:11
  • Journal article (peer-reviewed)abstract
    • Background: Dengue virus and Japanese encephalitis virus are two common flaviviruses that are spread widely by Aedes and Culex mosquitoes. Livestock keeping is vital for cities; however, it can pose the risk of increasing the mosquito population. Our study explored how livestock keeping in and around a large city is associated with the presence of mosquitoes and the risk of them spreading flaviviruses.Methods: An entomological study was conducted in 6 districts with 233 households with livestock, and 280 households without livestock, in Hanoi city. BG-Sentinel traps and CDC light traps were used to collect mosquitoes close to animal farms and human habitats. Adult mosquitoes were counted, identified to species level, and grouped into 385 pools, which were screened for flaviviruses using a pan-flavivirus qPCR protocol and sequencing.Results: A total of 12,861 adult mosquitoes were collected at the 513 households, with 5 different genera collected, of which the Culex genus was the most abundant. Our study found that there was a positive association between livestock keeping and the size of the mosquito population-most predominantly between pig rearing and Culex species (p < 0.001). One pool of Cx. tritaeniorhynchus, collected in a peri-urban district, was found to be positive for Japanese encephalitis virus.Conclusions: The risk of flavivirus transmission in urban areas of Hanoi city due to the spread of Culex and Aedes mosquitoes could be facilitated by livestock keeping.
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9.
  • Pham-Thanh, Long, et al. (author)
  • Zoonotic Flavivirus Exposure in Peri-Urban and Suburban Pig-Keeping in Hanoi, Vietnam, and the Knowledge and Preventive Practices of Pig Farmers
  • 2022
  • In: Tropical Medicine and Infectious Disease. - : MDPI. - 2414-6366. ; 7:5
  • Journal article (peer-reviewed)abstract
    • Mosquito-borne diseases (MBDs), including those caused by flaviviruses, remain human health problems for developing and urbanizing economies. This cross-sectional study examined risks of flavivirus exposure through a survey regarding knowledge and practices of pig farmers, and serological analysis of pigs in peri-urban and suburban Hanoi city. A total of 636 pig sera from 179 pig farms in 4 districts, namely, Chuong My, Dan Phuong, Ha Dong, and Bac Tu Liem, were analyzed by a competitive ELISA designed for flavivirus antibody detection. The results indicated a low level of awareness about MBDs among pig farmers, and a high seroprevalence in pigs at 88.5% (95%CI = 85.8-90.9%). Moreover, common practices of pig owners to prevent mosquitoes at home and farm did not show a significant reduction in flavivirus exposure in pigs. At animal level, significant associations between seropositive pigs and the farms with more than 60 pigs, and the district location were found. Farm-level multivariable analysis did not identify significant risk factors for flavivirus exposure. The study suggests that improving awareness of pig owners about MBDs in Hanoi city may be warranted to reduce the risk for MBD flavivirus infections in both humans and pigs.
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10.
  • Aavikko, R., et al. (author)
  • Clustering of vacancy defects in high-purity semi-insulating SiC
  • 2007
  • In: Physical Review B. Condensed Matter and Materials Physics. - 1098-0121 .- 1550-235X. ; 75:8, s. 085208-
  • Journal article (peer-reviewed)abstract
    • Positron lifetime spectroscopy was used to study native vacancy defects in semi-insulating silicon carbide. The material is shown to contain (i) vacancy clusters consisting of four to five missing atoms and (ii) Si-vacancy-related negatively charged defects. The total open volume bound to the clusters anticorrelates with the electrical resistivity in both as-grown and annealed materials. Our results suggest that Si-vacancy-related complexes electrically compensate the as-grown material, but migrate to increase the size of the clusters during annealing, leading to loss of resistivity. © 2007 The American Physical Society.
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11.
  • Anderson, Christopher P., et al. (author)
  • Electrical and optical control of single spins integrated in scalable semiconductor devices
  • 2019
  • In: Science. - : AMER ASSOC ADVANCEMENT SCIENCE. - 0036-8075 .- 1095-9203. ; 366:6470, s. 1225-
  • Journal article (peer-reviewed)abstract
    • Spin defects in silicon carbide have the advantage of exceptional electron spin coherence combined with a near-infrared spin-photon interface, all in a material amenable to modern semiconductor fabrication. Leveraging these advantages, we integrated highly coherent single neutral divacancy spins in commercially available p-i-n structures and fabricated diodes to modulate the local electrical environment of the defects. These devices enable deterministic charge-state control and broad Stark-shift tuning exceeding 850 gigahertz. We show that charge depletion results in a narrowing of the optical linewidths by more than 50-fold, approaching the lifetime limit. These results demonstrate a method for mitigating the ubiquitous problem of spectral diffusion in solid-state emitters by engineering the electrical environment while using classical semiconductor devices to control scalable, spin-based quantum systems.
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12.
  • Anderson, Christopher P., et al. (author)
  • Five-second coherence of a single spin with single-shot readout in silicon carbide
  • 2022
  • In: Science Advances. - : American Association for the Advancement of Science (AAAS). - 2375-2548. ; 8:5
  • Journal article (peer-reviewed)abstract
    • An outstanding hurdle for defect spin qubits in silicon carbide (SiC) is single-shot readout, a deterministic measurement of the quantum state. Here, we demonstrate single-shot readout of single defects in SiC via spin-to-charge conversion, whereby the defects spin state is mapped onto a long-lived charge state. With this technique, we achieve over 80% readout fidelity without pre- or postselection, resulting in a high signal-to-noise ratio that enables us to measure long spin coherence times. Combined with pulsed dynamical decoupling sequences in an isotopically purified host material, we report single-spin T-2 > 5 seconds, over two orders of magnitude greater than previously reported in this system. The mapping of these coherent spin states onto single charges unlocks both single-shot readout for scalable quantum nodes and opportunities for electrical readout via integration with semiconductor devices.
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13.
  • Aradi, B, et al. (author)
  • Boron centers in 4H-SiC
  • 2001
  • In: Materials science Forum, Vols. 353-356. ; , s. 455-458
  • Conference paper (peer-reviewed)abstract
    • The origin of the "deep boron related acceptor level" in SIC is subject to a lot of controversy. Based on ENDOR investigations, a B-Si+V-C model was suggested, while PL studies indicated the acceptor on the carbon sublattice. Our former ab initio LDA molecular cluster calculation showed that in the B-Si+V-C complex the carbon vacancy acts as the acceptor. Now, ah initio LDA supercell calculations have been carried out for boron-related complexes to calculate the occupation levels in 4H-SiC. It has been found that the 0/- level for the B-Si+V-C complex lies in the upper half of the gap, therefore it can be disregarded as the origin of the "deep boron-related acceptor level". Investigating other feasible boron-related complexes, B-Si+Si-C appears to be the best candidate.
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14.
  • Aradi, B., et al. (author)
  • Impurity-controlled dopant activation : Hydrogen-determined site selection of boron in silicon carbide
  • 2001
  • In: Applied Physics Letters. - : AIP Publishing. - 0003-6951 .- 1077-3118. ; 79:17, s. 2746-2748
  • Journal article (peer-reviewed)abstract
    • The geometry and formation energy of substitutional B and Al dopants as well as their complexes with hydrogen have been calculated in 4H-SiC using first-principles methods. Our results show that boron selecting the silicon site and, therefore, getting activated as a shallow acceptor depends on the presence of hydrogen which is promoted into the crystal by boron itself. Without hydrogen, boron would mostly be incorporated at the carbon site. Aluminum does not show this behavior: it always selects the silicon site and is incorporated independently of hydrogen. © 2001 American Institute of Physics.
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15.
  • Aradi, B, et al. (author)
  • Impurity-controlled dopant activation - The role of hydrogen in p-type doping of SiC
  • 2002
  • In: Materials Science Forum, Vols. 389-393. ; , s. 561-564
  • Conference paper (peer-reviewed)abstract
    • Hydrogen is a natural contaminant of SiC growth processes, and may influence the doping efficiency. Hydrogen incorporation proportional to that of boron was observed during CVD growth while the amount of hydrogen was two orders of magnitude less than the aluminum concentration. Passivation by complex formation with hydrogen has been proven both for Al and B. The experimentally observed reactivation energy of these complexes differ by 0.9 eV. Our ab initio supercell calculations in 4H-SiC indicate, that in the absence of hydrogen, boron is incorporated as isolated substitutional and prefers the carbon site, while under typical CVD conditions boron is incorporated together with hydrogen (in equal amounts), favoring the silicon site. Therefore, the presence of H is advantageous for the activation of B as a shallow acceptor. In contrast to boron, aluminum is incorporated independently of the presence of hydrogen as isolated substitutional at the silicon site. The calculated difference between the dissociation of the stable dopant plus hydrogen complexes agrees very well with experiments. Vibration frequencies for the dopant complexes have been also calculated.
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16.
  • Aradi, B., et al. (author)
  • Passivation of p-type dopants in 4H-SiC by hydrogen
  • 2001
  • In: Physica B, Vols. 308-310. ; , s. 722-725
  • Conference paper (peer-reviewed)abstract
    • Experimental investigations showed passivation of the p-type dopants B and Al in 4H-SiC by the formation of B+H and Al+H complexes. The dissociation energies of these complexes differed by 0.9 eV. Ab initio supercell calculations have been performed to investigate the interaction of H with B and Al in hexagonal 4H-SiC. The total energy, geometry and electronic structure of the possible complexes have been determined. Site dependencies have also been investigated. The most stable configurations were found with H at a bond center site next to B at the Si site, and with H at the antibonding site of a carbon atom which is first neighbor to Al at a Si site. Both the BSi+HBC and the AlSi+HAB(C) complexes turned out to be electrically inactive. The different structure of the passivated complexes explains the observed difference in their dissociation energy: the calculated difference of the binding energies of these complexes is 0.9 eV, which agrees well with the experimental finding. © 2001 Elsevier Science B.V. All rights reserved.
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17.
  • Astner, Thomas, et al. (author)
  • Vanadium in silicon carbide: telecom-ready spin centres with long relaxation lifetimes and hyperfine-resolved optical transitions
  • 2024
  • In: QUANTUM SCIENCE AND TECHNOLOGY. - : IOP Publishing Ltd. - 2058-9565. ; 9:3
  • Journal article (peer-reviewed)abstract
    • Vanadium in silicon carbide (SiC) is emerging as an important candidate system for quantum technology due to its optical transitions in the telecom wavelength range. However, several key characteristics of this defect family including their spin relaxation lifetime (T1), charge state dynamics, and level structure are not fully understood. In this work, we determine the T1 of an ensemble of vanadium defects, demonstrating that it can be greatly enhanced at low temperature. We observe a large spin contrast exceeding 90% and long spin-relaxation times of up to 25 s at 100 mK, and of order 1 s at 1.3 K. These measurements are complemented by a characterization of the ensemble charge state dynamics. The stable electron spin furthermore enables high-resolution characterization of the systems' hyperfine level structure via two-photon magneto-spectroscopy. The acquired insights point towards high-performance spin-photon interfaces based on vanadium in SiC.
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18.
  • Babin, Charles, et al. (author)
  • Fabrication and nanophotonic waveguide integration of silicon carbide colour centres with preserved spin-optical coherence
  • 2022
  • In: Nature Materials. - : NATURE PORTFOLIO. - 1476-1122 .- 1476-4660. ; 21, s. 67-73
  • Journal article (peer-reviewed)abstract
    • Colour centres are a promising quantum information platform, but coherence degradation after integration in nanostructures has hindered scalability. Here, the authors show that waveguide-integrated V-Si centres in SiC maintain spin-optical coherences, enabling nuclear high-fidelity spin qubit operations. Optically addressable spin defects in silicon carbide (SiC) are an emerging platform for quantum information processing compatible with nanofabrication processes and device control used by the semiconductor industry. System scalability towards large-scale quantum networks demands integration into nanophotonic structures with efficient spin-photon interfaces. However, degradation of the spin-optical coherence after integration in nanophotonic structures has hindered the potential of most colour centre platforms. Here, we demonstrate the implantation of silicon vacancy centres (V-Si) in SiC without deterioration of their intrinsic spin-optical properties. In particular, we show nearly lifetime-limited photon emission and high spin-coherence times for single defects implanted in bulk as well as in nanophotonic waveguides created by reactive ion etching. Furthermore, we take advantage of the high spin-optical coherences of V-Si centres in waveguides to demonstrate controlled operations on nearby nuclear spin qubits, which is a crucial step towards fault-tolerant quantum information distribution based on cavity quantum electrodynamics.
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19.
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20.
  • Booker, Ian Don, et al. (author)
  • Donor and double donor transitions of the carbon vacancy related EH6/7 deep level in 4H-SiC
  • 2016
  • In: Journal of Applied Physics. - : American Institute of Physics (AIP). - 0021-8979 .- 1089-7550. ; 119:23
  • Journal article (peer-reviewed)abstract
    • Using medium- and high-resolution multi-spectra fitting of deep level transient spectroscopy (DLTS), minority carrier transient spectroscopy (MCTS), optical O-DLTS and optical-electrical (OE)-MCTS measurements, we show that the EH6∕7 deep level in 4H-SiC is composed of two strongly overlapping, two electron emission processes with thermal activation energies of 1.49 eV and 1.58 eV for EH6 and 1.48 eV and 1.66 eV for EH7. The electron emission peaks of EH7 completely overlap while the emission peaks of EH6 occur offset at slightly different temperatures in the spectra. OE-MCTS measurements of the hole capture cross section σp 0(T) in p-type samples reveal a trap-Auger process, whereby hole capture into the defect occupied by two electrons leads to a recombination event and the ejection of the second electron into the conduction band. Values of the hole and electron capture cross sections σn(T) and σp(T) differ strongly due to the donor like nature of the deep levels and while all σn(T) have a negative temperature dependence, the σp(T) appear to be temperature independent. Average values at the DLTS measurement temperature (∼600 K) are σn 2+(T) ≈ 1 × 10−14 cm2, σn +(T) ≈ 1 × 10−14 cm2, and σp 0(T) ≈ 9 × 10−18 cm2 for EH6 and σn 2+(T) ≈ 2 × 10−14 cm2, σn +(T) ≈ 2 × 10−14 cm2, σp 0(T) ≈ 1 × 10−20 cm2 for EH7. Since EH7 has already been identified as a donor transition of the carbon vacancy, we propose that the EH6∕7 center in total represents the overlapping first and second donor transitions of the carbon vacancy defects on both inequivalent lattice sites.
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21.
  • Bosma, Tom, et al. (author)
  • Broadband single-mode planar waveguides in monolithic 4H-SiC
  • 2022
  • In: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 131:2
  • Journal article (peer-reviewed)abstract
    • Color-center defects in silicon carbide promise opto-electronic quantum applications in several fields, such as computing, sensing, and communication. In order to scale down and combine these functionalities with the existing silicon device platforms, it is crucial to consider SiC integrated optics. In recent years, many examples of SiC photonic platforms have been shown, like photonic crystal cavities, film-on-insulator waveguides, and micro-ring resonators. However, all these examples rely on separating thin films of SiC from substrate wafers. This introduces significant surface roughness, strain, and defects in the material, which greatly affects the homogeneity of the optical properties of color centers. Here, we present and test a method for fabricating monolithic single-crystal integrated-photonic devices in SiC: tuning optical properties via charge carrier concentration. We fabricated monolithic SiC n-i-n and p-i-n junctions where the intrinsic layer acts as waveguide core, and demonstrate the waveguide functionality for these samples. The propagation losses are below 14 dB/cm. These waveguide types allow for addressing color centers over a broad wavelength range with low strain-induced inhomogeneity of the optical-transition frequencies. Furthermore, we expect that our findings open the road to fabricating waveguides and devices based on p-i-n junctions, which will allow for integrated electrostatic and radio frequency control together with high-intensity optical control of defects in silicon carbide.
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22.
  • Bosma, Tom, et al. (author)
  • Identification and tunable optical coherent control of transition-metal spins in silicon carbide
  • 2018
  • In: NPJ QUANTUM INFORMATION. - : SPRINGERNATURE. - 2056-6387. ; 4
  • Journal article (peer-reviewed)abstract
    • Color centers in wide-bandgap semiconductors are attractive systems for quantum technologies since they can combine long-coherent electronic spin and bright optical properties. Several suitable centers have been identified, most famously the nitrogen-vacancy defect in diamond. However, integration in communication technology is hindered by the fact that their optical transitions lie outside telecom wavelength bands. Several transition-metal impurities in silicon carbide do emit at and near telecom wavelengths, but knowledge about their spin and optical properties is incomplete. We present all-optical identification and coherent control of molybdenum-impurity spins in silicon carbide with transitions at near-infrared wavelengths. Our results identify spin S= 1/2 for both the electronic ground and excited state, with highly anisotropic spin properties that we apply for implementing optical control of ground-state spin coherence. Our results show optical lifetimes of similar to 60 ns and inhomogeneous spin dephasing times of similar to 0.3 mu S, establishing relevance for quantum spin-photon interfacing.
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23.
  • Bourassa, Alexandre, et al. (author)
  • Entanglement and control of single nuclear spins in isotopically engineered silicon carbide
  • 2020
  • In: Nature Materials. - : NATURE RESEARCH. - 1476-1122 .- 1476-4660. ; 19:12, s. 1319-1325
  • Journal article (peer-reviewed)abstract
    • Isotope engineering of silicon carbide leads to control of nuclear spins associated with single divacancy centres and extended electron spin coherence. Nuclear spins in the solid state are both a cause of decoherence and a valuable resource for spin qubits. In this work, we demonstrate control of isolated(29)Si nuclear spins in silicon carbide (SiC) to create an entangled state between an optically active divacancy spin and a strongly coupled nuclear register. We then show how isotopic engineering of SiC unlocks control of single weakly coupled nuclear spins and present an ab initio method to predict the optimal isotopic fraction that maximizes the number of usable nuclear memories. We bolster these results by reporting high-fidelity electron spin control (F = 99.984(1)%), alongside extended coherence times (Hahn-echoT(2) = 2.3 ms, dynamical decouplingT(2)(DD) > 14.5 ms), and a >40-fold increase in Ramsey spin dephasing time (T-2*) from isotopic purification. Overall, this work underlines the importance of controlling the nuclear environment in solid-state systems and links single photon emitters with nuclear registers in an industrially scalable material.
  •  
24.
  • Broitman, E, et al. (author)
  • Water adsorption on fullerene-like carbon nitride overcoats
  • 2008
  • In: Thin Solid Films. - : Elsevier BV. - 0040-6090 .- 1879-2731. ; 517:3, s. 1106-1110
  • Journal article (peer-reviewed)abstract
    • Humidity influences the tribological performance of the head-disk interface in magnetic data storage devices. In this work we compare the uptake of water of amorphous carbon nitride (a-CNx) films, widely used as protective overcoats in computer disk drive systems, with fullerene-like carbon nitride (FL-CNx) and amorphous carbon (a-C) films. Films with thickness in the range 10-300 run were deposited on quartz crystal substrates by reactive DC magnetron sputtering. A quartz crystal microbalance placed in a vacuum chamber was used to measure the water adsorption. Electron paramagnetic resonance (EPR) has been used to correlate water adsorption with film microstructure and surface defects (dangling bonds). Measurements indicate that the amount of adsorbed water is highest for the pure a-C films and that the FL-CNx films adsorbed less than a-CNx. EPR data correlate the lower water adsorption on FL-CNx films with a possible lack of dangling bonds on the film surface. To provide additional insight into the atomic structure of defects in the FL-CNx, a-CNx and a-C compounds, we performed first-principles calculations within the framework of Density Functional Theory. Emphasis was put on the energy cost for formation of vacancy defects and dangling bonds in relaxed systems. Cohesive energy comparison reveals that the energy cost formation for dangling bonds in different configurations is considerably higher in FL-CNx than for the amorphous films. These simulations thus confirm the experimental results showing that dangling bonds are much less likely in FL-CNx than in a-CNx and a-C films.
  •  
25.
  • Bulancea Lindvall, Oscar, et al. (author)
  • Dipolar spin relaxation of divacancy qubits in silicon carbide
  • 2021
  • In: npj Computational Materials. - : Nature Portfolio. - 2057-3960. ; 7:1
  • Journal article (peer-reviewed)abstract
    • Divacancy spins implement qubits with outstanding characteristics and capabilities in an industrial semiconductor host. On the other hand, there are still numerous open questions about the physics of these important defects, for instance, spin relaxation has not been thoroughly studied yet. Here, we carry out a theoretical study on environmental spin-induced spin relaxation processes of divacancy qubits in the 4H polytype of silicon carbide (4H-SiC). We reveal all the relevant magnetic field values where the longitudinal spin relaxation time T-1 drops resonantly due to the coupling to either nuclear spins or electron spins. We quantitatively analyze the dependence of the T-1 time on the concentration of point defect spins and the applied magnetic field and provide an analytical expression. We demonstrate that dipolar spin relaxation plays a significant role both in as-grown and ion-implanted samples and it often limits the coherence time of divacancy qubits in 4H-SiC.
  •  
26.
  • Bulancea Lindvall, Oscar, et al. (author)
  • Isotope-Purification-Induced Reduction of Spin-Relaxation and Spin-Coherence Times in Semiconductors
  • 2023
  • In: Physical Review Applied. - : AMER PHYSICAL SOC. - 2331-7019. ; 19:6
  • Journal article (peer-reviewed)abstract
    • Paramagnetic defects and nuclear spins are often the major sources of decoherence and spin relaxation in solid-state qubits realized by optically addressable point defect spins in semiconductors. It is commonly accepted that a high degree of depletion of nuclear spins can enhance the coherence time by reducing magnetic noise. Here we show that the isotope purification beyond a certain optimal level can become contraproductive when both electron and nuclear spins are present in the vicinity of the qubits, particularly for half-spin systems. Using state-of-the-art numerical tools and considering the silicon-vacancy qubit in various spin environments, we demonstrate that the coupling of the spin-3/2 qubit to a spin bath of spin-1/2 point defects in the lattice can be significantly enhanced by isotope purification. The enhanced coupling shortens the spin-relaxation time that in turn may limit the coherence time of spin qubits. Our results can be generalized to triplet point defect qubits, such as the nitrogen-vacancy center in diamond and the divacancy in silicon carbide.
  •  
27.
  • Bulancea Lindvall, Oscar, et al. (author)
  • Low-Field Microwave-Free Magnetometry Using the Dipolar Spin Relaxation of Quartet Spin States in Silicon Carbide
  • 2023
  • In: Physical Review Applied. - : AMER PHYSICAL SOC. - 2331-7019. ; 19:3
  • Journal article (peer-reviewed)abstract
    • Paramagnetic defects and nuclear spins are the major sources of magnetic-field-dependent spin relaxation in point-defect quantum bits. The detection of related optical signals has led to the development of advanced relaxometry applications with high spatial resolution. The nearly degenerate quartet ground state of the silicon-vacancy qubit in silicon carbide (SiC) is of special interest in this respect, as it gives rise to relaxation-rate extrema at vanishing magnetic field values and emits in the first near-infrared transmission window of biological tissues, providing an opportunity for the development of sensing applications for medicine and biology. However, the relaxation dynamics of the silicon-vacancy center in SiC have not yet been fully explored. In this paper, we present results from a comprehensive theoretical investigation of the dipolar spin relaxation of the quartet spin states in various local spin environments. We discuss the underlying physics and quantify the magnetic field and spin-bath-dependent relaxation time T1. Using these findings, we demonstrate that the silicon-vacancy qubit in SiC can implement microwave-free low-magnetic-field quantum sensors of great potential.
  •  
28.
  •  
29.
  • Carlsson, Patrick, et al. (author)
  • Deep levels in low-energy electron-irradiated 4H-SiC
  • 2009
  • In: PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS. - : Wiley. - 1862-6254. ; 3:4, s. 121-123
  • Journal article (peer-reviewed)abstract
    • Deep levels introduced by low-energy (200 keV) electron irradiation in n-type 4H-SiC epitaxial layers grown by chemical vapour deposition were studied by deep level transient spectroscopy (DLTS) and photoexcitation electron paramagnetic resonance (photo-EPR). After irradiation, several DLTS levels, EH1, EH3, Z(1/2), EH5 and EH6/7, often reported in irradiated 4H-SiC, were observed. In irradiated freestanding films from the same wafer, the EPR signals of the carbon vacancy in the positive and negative charge states, V-C(+) and V-C(-), respectively, can be observed simultaneously under illumination with light of certain photon energies. Comparing the ionization energies obtained from DLTS and photo-EPR, we suggest that the EH6/7 (at similar to E-C - 1.6 eV) and EH5 (at similar to E-C - 1.0 eV) electron traps may be related to the single donor (+ vertical bar 0) and the double acceptor (1- vertical bar 2-) level of V-C, respectively. Judging from the relative intensity of the DLTS signals, the EH6/7 level may also be contributed to by other unidentified defects.
  •  
30.
  • Carlsson, Patrick, 1975- (author)
  • Electron paramagnetic resonance study of defects in SiC
  • 2010
  • Doctoral thesis (other academic/artistic)abstract
    • Silicon carbide (SiC) is a wide bandgap semiconductor (energy gap of 3.26 eV and 3.03 eV for 4Hand 6H-SiC, respectively). With outstanding physical and electronic properties, SiC is a promising material for high-power, high-frequency and high-temperature applications. The electronic properties of a semiconductor are to a large extent determined by point defects in the crystal. As known from other semiconductors, defect control is crucially important for the successful device applications. Point defects can be impurities, such as the shallow nitrogen (N) donor or boron acceptor (the residual n- and p-type dopants in SiC), or intrinsic defects, such as vacancies, antisites, interstitials or combinations thereof. One of the key issues in the SiC technology is to develop semi insulating (SI) SiC substrates required for SiC MEtal Semiconductor Field Effect Transistors (MESFETs) and also for III-nitride based High Electron Mobility Transistors (HEMTs), to reduce the parasitic capacitance and to improve the device performance. For achieving the SI behavior the Fermi level should be pinned near the middle of the bandgap. This can be realized using defects with deep acceptor level(s) to compensate the residual shallow N donors which cause the natural ntype doping of as-grown SiC.Vanadium (V) doped SI SiC has been developed since the 1990s. However, SiC MESFETs using V-doped SI SiC substrates are shown to have severe problems with electron trapping to eep levels in the SI substrates which causes reduction of the drain current and instability of the device performance. Since the beginning of this decade, V-free high-purity SI (HPSI) SiC substrates using intrinsic defects to compensate the N donors have been developed. The work in this thesis has been devoted to characterize defects in HPSI SiC using electron paramagnetic resonance (EPR). EPR detects transitions between energy levels split up by the interaction of unpaired electron spins (localized at the defect and neighboring atoms) with an applied magnetic field. Thanks to the sensitivity of the electron spins to their surroundings; especially to nearby nuclear spins that further splits the energy levels by the so-called hyperfine (hf) interaction, one can extract information on the structure and electronic configuration of a defect.The work has been focused on (i) the identification of prominent defects, (ii) the determination of their energy levels and roles in the carrier compensation processes, (iii) the defect interaction and the stability of the SI properties at high temperatures, in order to identify the optimal defect(s) to be used for controlling the SI properties. EPR and ab initio supercell calculations have been the main tools for defect identification and all three common polytypes 3C-, 4H- and 6H-SiC of different conducting types (n-, p-type and SI) have been investigated. For determination of the energy levels in the bandgap, the combined results of EPR and photoexcitation EPR (photo-EPR), Deep Level Transient Spectroscopy (DLTS), the temperature dependence of the resistivity, and ab initio calculations have been evaluated. Annealing studies up to 1600 °C for samples with different defect compositions have been carried out for obtaining knowledge on the defect interaction and thermal stability of the SI properties as well as the change in resistivity, activation energy and defect concentration. Below is a short summary of the papers included in the thesis.In paper 1, the identification of the neutrally charged divacancy (VCVSi 0) in 4H-SiC, by PR and ab initio calculations, is presented. The divacancy is a common defect in SiC and it is thought to play a role in carrier compensation in HPSI SiC. Annealing studies show that it is formed during migration of carbon vacancies (VC) and silicon vacancies (VSi) and in the studied samples it is thermally stable up to at least 1500 °C.Paper 2 presents EPR identification of prominent defects in different types of HPSI 4H-SiC substrates grown by high-temperature chemical vapor deposition (HTCVD) and physical vapor transport (PVT), the determination of some of their deep acceptor levels and their roles in carrier compensation processes. VSi, VC, carbon antisite-vacany pair (CSiVC), and VCVSi were found to be the most common defects in different types of HPSI 4H-SiC. The samples could be grouped into three activation energy ranges Ea~0.8–0.9 eV, ~1.1–1.3 eV, and ~1.5 eV, and the possible defect levels related to these energies were discussed for each group. The samples with Ea~1.5 eV contain high concentrations of VC and VCVSi and low concentrations of VSi and as these samples had the most thermally stable SI properties, due to the increased thermal stability of VC when VSi is absent, we concluded that this defect composition is preferable.A similar study is presented in paper 4 of different types of HPSI 6H-SiC substrates grown by HTCVD. The samples could be grouped into two activation energy ranges Ea~0.6-0.7 eV and ~1.0-1.2 eV. VC, CSiVC and VCVSi were found to be the prominent defects and the relationship between their energy levels and the activation energies was discussed. The  materials were still SI after annealing up to 1600°C although the activation energies were lowered. The (+|0) level of VC was also specifically studied by photo-EPR and determined to be located at ~1.47 eV above the valence band, similar to 4H-SiC.The content of Paper 3 concerns an EPR study of two defects, labeled L5 and L6, in electron irradiated n-type 3C-SiC. The L5 defect could be related to the neutrally charged divacancy as it shows some features similar to the divacancy in 4H-SiC. The L5 defect anneals out at low temperatures (~200°C) and could possibly be carbon interstitial related.Paper 5 presents an attempt to study the energy levels of VC by photo-EPR without the usual interference from other defect levels. By using pure free-standing n-type 4H-SiC epilayers with very low defect concentrations and low-energy electron (200 keV) irradiation we could combine photo-EPR and DLTS to study energy levels related to VC.VC+ and VC- could be detected simultaneously and from the study we concluded that the (+|0) is located at ~EC–1.77 eV and suggested that the (0|−) and (1−|2−) levels are located at ~EC–0.8 eV and ~ EC–1.0 eV, respectively.The investigation in paper 6 concerns the identification of the EI4 EPR center in 4H- and 6HSiC. Based on detailed studies of the hf interactions, the annealing behavior and ab initio supercell calculations we believe the corresponding defect is a complex between a carbon vacancy-carbon antisite and a carbon vacancy at the third neighbor site of the antisite in the neutral charge state, (VC-CSiVC)0. It could be directly involved in carrier compensation in some samples before it anneals out (at ~850 °C in irradiated samples or higher temperatures in as-grown sample) and also seems to be an intermediate state in the formation of the divacancy.In Paper 7, an EPR study of a radiation-induced defect, labeled LE5, in 4H- and 6H-SiC is presented. The observation of the LE5 spectra in samples irradiated at low temperatures (77-100 K) indicates that it is a primary defect. From the low symmetry (C1), the Si hf structures, and the low anneal-out temperature (~600-750 °C) we suggested that the defect may be a complex involving a silicon antisite (SiC) perturbed by a nearby defect.
  •  
31.
  • Carlsson, Patrick, 1975-, et al. (author)
  • Electron paramagnetic resonance study on n-type electron-irradiated 3C-SiC
  • 2008
  • In: PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY. - BRISTOL, ENGLAND : IOP PUBLISHING LTD.
  • Conference paper (peer-reviewed)abstract
    • Electron Paramagnetic Resonance (EPR) was used to study defects in n-type 3C-SiC films irradiated by 3-MeV electrons at room temperature with a dose of 2x10(18) cm(-2). After electron irradiation, two new EPR spectra with an effective spin S = 1, labeled L5 and L6, were observed. The L5 center has C-3v symmetry with g = 2.004 and a fine-structure parameter D = 436.5 x 10(-4) cm(-1). The L5 spectrum was only detected under light illumination and it could not be detected after annealing at similar to 550 C. The principal z-axis of the D tensor is parallel to the < 111 >-directions, indicating the location of spins along the Si-C bonds. Judging from the symmetry and the fact that the signal was detected under illumination in n-type material, the L5 center may be related to the divacancy in the neutral charge state. The L6 center has a C-2v-symmetry with an isotropic g-value of g=2.003 and the fine structure parameters D=547.7 x 10(-4) cm-1 and E=56.2 x 10(-4) cm(-1). The L6 center disappeared after annealing at a rather low temperature (similar to 200 degrees C), which is substantially lower than the known annealing temperatures for vacancy-related defects in 3C-SiC. This highly mobile defect may be related to carbon interstitials.
  •  
32.
  • Carlsson, Patrick, 1975-, et al. (author)
  • EPR and ab initio calculation study on the EI4 center in 4H and 6H-SiC
  • 2010
  • In: Physical Review B. Condensed Matter and Materials Physics. - : American Physical Society. - 1098-0121 .- 1550-235X. ; 82:23, s. 235203-
  • Journal article (peer-reviewed)abstract
    • We present new results from electron paramagnetic resonance (EPR) studies of the EI4 EPR center in 4H- and 6H-SiC. The EPR signal of the EI4 center was found to be drastically enhanced in electron-irradiated high-purity semi-insulating materials after annealing at 700-750°C. Strong EPR signals of the EI4 center with minimal interferences from other radiation-induced defects in irradiated high-purity semiinsulating materials allowed our more detailed study of the hyperfine (hf) structures. An additional large-splitting 29Si hf structure and 13C hf lines of the EI4 defect were observed. Comparing the data on the defect formation, the hf interactions and the annealing behavior obtained from EPR experiments and from ab initio supercell calculations of different carbon-vacancy related complexes, we suggest a complex between a carbon vacancy-carbon antisite and a carbon vacancy at the third neighbor site of the antisite in the neutral charge state, (VC-CSiVC)0, as a new defect model for the EI4 center.
  •  
33.
  • Carlsson, Patrick, 1975-, et al. (author)
  • Intrinsic Defects in HPSI 6H-SiC : an EPR Study
  • 2009
  • In: Materials Science Forum, Vols. 600-603. - : Trans Tech Publications. ; , s. 381-384
  • Conference paper (peer-reviewed)abstract
    • High-purity, semi-insulating 6H-SiC substrates grown by high-temperature chemical vapor deposition were studied by electron paramagnetic resonance (EPR). The carbon vacancy (VC), the carbon vacancy-antisite pair (VCCSi) and the divacancy (VCVSi) were found to be prominent defects. The (+|0) level of VC in 6H-SiC is estimated by photoexcitation EPR (photo-EPR) to be at ~ 1.47 eV above the valence band. The thermal activation energies as determined from the temperature dependence of the resistivity, Ea~0.6-0.7 eV and ~1.0-1.2 eV, were observed for two sets of samples and were suggested to be related to acceptor levels of VC, VCCSi and VCVSi. The annealing behavior of the intrinsic defects and the stability of the SI properties were studied up to 1600°C.
  •  
34.
  • Carlsson, Patrick, 1975-, et al. (author)
  • Photo-EPR Studies on Low-Energy Electron-irradiated 4H-SiC
  • 2009
  • In: Materials Science Forum, Vols. 615-617. - Materials Science Forum Vols. 615-617 : Trans Tech Publications. - 9780878493340 ; , s. 401-404
  • Conference paper (peer-reviewed)abstract
    • Photoexcitation electron paramagnetic resonance (photo-EPR) was used to determine deep levels related to the carbon vacancy (VC) in 4H-SiC. High-purity free-standing n-type 4H-SiC epilayers with concentration of intrinsic defects (except the photo-insensitive SI1 center) below the detection limit of EPR were irradiated with low-energy (200 keV) electrons to create mainly VC and defects related to the C sublattice. The simultaneous observation of and signals, their relative intensity changes and the absence of other defects in the sample provide a more straight and reliable interpretation of the photo-EPR results. The study suggests that the (+|0) level of VC is located at ~EC–1.77 eV in agreement with previously reported results and its single and double acceptor levels may be at ~ EC–0.8 eV and ~ EC–1.0 eV, respectively.
  •  
35.
  • Carlsson, Patrick, et al. (author)
  • Silicon antisite related defects in electron-irradiated p-type 4H- and 6H-SiC
  • Other publication (other academic/artistic)abstract
    • The electron paramagnetic resonance (EPR) LE5 centers were previously observed in electron-irradiated p-type 4H- and 6H-SiC but have not been identified due to lack of experimental data. In this study, two different Si hyperfine (hf) structures of the LE5 centers have been detected and the corresponding hf tensors have been determined. One structure is due to a very anisotropic hf interaction with one Si atom and the other structure to the hf interaction with two neighboring Si atoms in the basal plane. The obtained g values and Si hf constants are in good agreement with calculated parameters reported for antisite pairs in 4H-SiC. Based on the similarity in the spin-Hamiltonian parameters, the LE5 centers may be the antisite pairs in the positive charge state.
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36.
  • Carlsson, Patrick, 1975-, et al. (author)
  • The EI4 EPR centre in 6H SiC
  • 2010
  • In: Physica Scripta, Vol. T141. - : IOP Publishing. ; , s. 014013-
  • Conference paper (peer-reviewed)abstract
    • We present the results of our recent electron paramagnetic resonance (EPR) studies of the EI4 EPR centre in electron-irradiated high-purity semi-insulating 6H SiC. Higher signal intensities and better resolution compared with previous studies have enabled a more detailed study of the hyperfine (hf) structure. Based on the observed hf structure due to the interaction with Si and C neighbours, the effective spin S = 1, the C-1h-symmetry and the annealing behaviour, we suggest a carbon vacancy-carbon antisite complex in the neutral charge state, VCVCCSi0, with the vacancies and the antisite in the basal plane, as a new defect model for the centre.
  •  
37.
  • Christle, David J., et al. (author)
  • Isolated electron spins in silicon carbide with millisecond coherence times
  • 2015
  • In: Nature Materials. - : Nature Publishing Group. - 1476-1122 .- 1476-4660. ; 14:2, s. 160-163
  • Journal article (peer-reviewed)abstract
    • The elimination of defects from SiC has facilitated its move to the forefront of the optoelectronics and power-electronics industries(1). Nonetheless, because certain SiC defects have electronic states with sharp optical and spin transitions, they are increasingly recognized as a platform for quantum information and nanoscale sensing(2-16). Here, we show that individual electron spins in high-purity monocrystalline 4H-SiC can be isolated and coherently controlled. Bound to neutral divacancy defects(2,3), these states exhibit exceptionally long ensemble Hahn-echo spin coherence times, exceeding 1 ms. Coherent control of single spins in a material amenable to advanced growth and microfabrication techniques is an exciting route towards wafer-scale quantum technologies.
  •  
38.
  • Christle, David J., et al. (author)
  • Isolated Spin Qubits in SiC with a High-Fidelity Infrared Spin-to-Photon Interface
  • 2017
  • In: Physical Review X. - : AMER PHYSICAL SOC. - 2160-3308. ; 7:2
  • Journal article (peer-reviewed)abstract
    • The divacancies in SiC are a family of paramagnetic defects that show promise for quantum communication technologies due to their long-lived electron spin coherence and their optical addressability at near-telecom wavelengths. Nonetheless, a high-fidelity spin-photon interface, which is a crucial prerequisite for such technologies, has not yet been demonstrated. Here, we demonstrate that such an interface exists in isolated divacancies in epitaxial films of 3C-SiC and 4H-SiC. Our data show that divacancies in 4H-SiC have minimal undesirable spin mixing, and that the optical linewidths in our current sample are already similar to those of recent remote entanglement demonstrations in other systems. Moreover, we find that 3C-SiC divacancies have a millisecond Hahn-echo spin coherence time, which is among the longest measured in a naturally isotopic solid. The presence of defects with these properties in a commercial semiconductor that can be heteroepitaxially grown as a thin film on Si shows promise for future quantum networks based on SiC defects.
  •  
39.
  • Cilibrizzi, Pasquale, et al. (author)
  • Ultra-narrow inhomogeneous spectral distribution of telecom-wavelength vanadium centres in isotopically-enriched silicon carbide
  • 2023
  • In: Nature Communications. - : NATURE PORTFOLIO. - 2041-1723. ; 14:1
  • Journal article (peer-reviewed)abstract
    • Spin-active quantum emitters have emerged as a leading platform for quantum technologies. However, one of their major limitations is the large spread in optical emission frequencies, which typically extends over tens of GHz. Here, we investigate single V4+ vanadium centres in 4H-SiC, which feature telecom-wavelength emission and a coherent S = 1/2 spin state. We perform spectroscopy on single emitters and report the observation of spin-dependent optical transitions, a key requirement for spin-photon interfaces. By engineering the isotopic composition of the SiC matrix, we reduce the inhomogeneous spectral distribution of different emitters down to 100 MHz, significantly smaller than any other single quantum emitter. Additionally, we tailor the dopant concentration to stabilise the telecom-wavelength V4+ charge state, thereby extending its lifetime by at least two orders of magnitude. These results bolster the prospects for single V emitters in SiC as material nodes in scalable telecom quantum networks. Several solid-state defect platforms have been proposed for application as a spin-photon interface in quantum communication networks. Here the authors report spin-selective optical transitions and narrow inhomogeneous spectral distribution of V centers in isotopically-enriched SiC emitting in the telecom O-band.
  •  
40.
  • Csore, A., et al. (author)
  • Fluorescence spectrum and charge state control of divacancy qubits via illumination at elevated temperatures in 4H silicon carbide
  • 2022
  • In: Physical Review B. - : AMER PHYSICAL SOC. - 2469-9950 .- 2469-9969. ; 105:16
  • Journal article (peer-reviewed)abstract
    • Divacancy in its neutral charge state () in 4H silicon carbide (SiC) is a leading quantum bit (qubit) contender. Owing to the lattice structure of 4H SiC, four different VCVSi configurations can be formed. The ground and the optically accessible excited states of configurations exhibit a high-spin state, and the corresponding optical transition energies are around ≈1.1eV falling in the near-infrared wavelength region. Recently, photoluminescence (PL) quenching has been experimentally observed for all configurations in 4H SiC at cryogenic temperatures. It has been shown that is converted to and it remains in this shelving dark state at cryogenic temperatures until photoexcitation with the threshold energies or above is applied to convert back to . In this study, we demonstrate both in experiments and theory that the threshold energy for reionization is temperature dependent. We carry out density functional theory (DFT) calculations in order to investigate the temperature dependent reionization spectrum, i.e., the spectrum of the process. We find that simultaneous optical reionization and qubit manipulation can be carried out at room temperature with photoexcitation at the typical excitation wavelength used for readout of the divacancy qubits in 4H SiC, in agreement with our experimental data. We also provide the analysis of the PL spectrum of , characteristic for each configuration in 4H SiC, using the Huang-Rhys theory, and find that one configuration in 4H SiC stands out in terms of the strength of coherent emission among the four configurations. 
  •  
41.
  •  
42.
  • Davidsson, Joel, et al. (author)
  • First principles predictions of magneto-optical data for semiconductor point defect identification: the case of divacancy defects in 4H-SiC
  • 2018
  • In: New Journal of Physics. - : IOP PUBLISHING LTD. - 1367-2630. ; 20
  • Journal article (peer-reviewed)abstract
    • Study and design of magneto-optically active single point defects in semiconductors are rapidly growing fields due to their potential in quantum bit (qubit) and single photon emitter applications. Detailed understanding of the properties of candidate defects is essential for these applications, and requires the identification of the defects microscopic configuration and electronic structure. In multicomponent semiconductors point defects often exhibit several non-equivalent configurations of similar but different characteristics. The most relevant example of such point defect is the divacancy in silicon carbide, where some of the non-equivalent configurations implement room temperature qubits. Here, we identify four different configurations of the divacancy in 4H-SiC via the comparison of experimental measurements and results of first-principle calculations. In order to accomplish this challenging task, we carry out an exhaustive numerical accuracy investigation of zero-phonon line and hyperfine coupling parameter calculations. Based on these results, we discuss the possibility of systematic quantum bit search.
  •  
43.
  • Davidsson, Joel, et al. (author)
  • Identification of divacancy and silicon vacancy qubits in 6H-SiC
  • 2019
  • In: Applied Physics Letters. - : AMER INST PHYSICS. - 0003-6951 .- 1077-3118. ; 114:11
  • Journal article (peer-reviewed)abstract
    • Point defects in semiconductors are relevant for use in quantum technologies as room temperature qubits and single photon emitters. Among suggested defects for these applications are the negatively charged silicon vacancy and the neutral divacancy in SiC. The possible nonequivalent configurations of these defects have been identified in 4H-SiC, but for 6H-SiC, the work is still in progress. In this paper, we identify the different configurations of the silicon vacancy and the divacancy defects to each of the V1-V3 and the QL1-QL6 color centers in 6H-SiC, respectively. We accomplish this by comparing the results from ab initio calculations with experimental measurements for the zero-phonon line, hyperfine tensor, and zero-field splitting. Published under license by AIP Publishing.
  •  
44.
  • de las Casas, Charles F., et al. (author)
  • Stark tuning and electrical charge state control of single divacancies in silicon carbide
  • 2017
  • In: Applied Physics Letters. - : AMER INST PHYSICS. - 0003-6951 .- 1077-3118. ; 111:26
  • Journal article (peer-reviewed)abstract
    • Neutrally charged divacancies in silicon carbide (SiC) are paramagnetic color centers whose long coherence times and near-telecom operating wavelengths make them promising for scalable quantum communication technologies compatible with existing fiber optic networks. However, local strain inhomogeneity can randomly perturb their optical transition frequencies, which degrades the indistinguishability of photons emitted from separate defects and hinders their coupling to optical cavities. Here, we show that electric fields can be used to tune the optical transition frequencies of single neutral divacancy defects in 4H-SiC over a range of several GHz via the DC Stark effect. The same technique can also control the charge state of the defect on microsecond timescales, which we use to stabilize unstable or non-neutral divacancies into their neutral charge state. Using fluorescence-based charge state detection, we show that both 975 nm and 1130 nm excitation can prepare their neutral charge state with near unity efficiency. (C) 2017 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons. org/licenses/by/4.0/).
  •  
45.
  • Deak, P, et al. (author)
  • A cause for SiC/SiO2 interface states : The site selection of oxygen in SiC
  • 2003
  • In: Materials Science Forum, Vols. 433-436. ; , s. 535-538
  • Conference paper (peer-reviewed)abstract
    • We show that in the SiC/SiO2 system the interface states in the lower half of the gap are the consequence of the behavior of oxygen in SiC. Investigating the elemental steps of oxidation on a simple model by means of ab initio density functional calculations we find that, in course of the oxidation, carbon-vacancy (V-C) - oxygen complexes constantly arise. The V-C+O complexes have donor states around E-V+0.8 eV. Their presence gives rise to a thin transition layer which is not SiO2 but an oxygen contaminated Si-rich interface layer producing the aforementioned gap states.
  •  
46.
  • Deak, P, et al. (author)
  • Vacancies and their complexes with H in SiC
  • 2000
  • In: Materials Science Forum, Vols. 338-343. - Stafa-Zurich, Switzerland : Trans Tech Publications Inc.. ; , s. 817-820
  • Conference paper (peer-reviewed)abstract
    • Ab initio calculations (LDA and MCSF) have been carried out for vacancies (V-Si and V-C) and interstitial H, as well as for V+H complexes in 3C SiC. Relative stability of different charge-states/configurations and occupation levels were determined in supercells with plane wave basis sets while vibration frequencies and spin distributions were calculated in clusters with localized basis functions. Both types of vacancies show amphoteric electrical activity. In equilibrium, atomic He is at the AB(C), and H is at the T-Si site, while H-0 does not appear to be stable with respect to them, so H can also act both as a deep donor and an electron trap. Hydrogen can passivate the V-Si acceptor but not the V-C donor. Conditions for the formation of the possible V+H centers and their properties are given and used to discuss experimental information (or the lack of them) about H in SiC.
  •  
47.
  • Duc, Tran Thien, et al. (author)
  • Capture cross section of electron-irradiation-induced defects in bulk GaN grown by halide vapor phase epitaxy
  • 2014
  • Other publication (other academic/artistic)abstract
    • Electron-irradiation-induced defects in GaN grown by halide vapor phase epitaxy is studied by deep level transient spectroscopy in which the capture cross section and its temperature dependence of the deep levels was determined by the filling pulse method. Before irradiation, one trap level, labelled ET4 (EC – 0.244 eV), was observed. After performing electron irradiation with an energy of 2 MeV at a fluence of 5 × 1016 cm-2, four deep trap levels, labelled ET1 (EC – 0.178 eV), ET2 (EC – 0.181 eV), ET3 (EC – 0.256 eV) and ET5 appeared. After annealing at 650K for 2 hours, only two irradiation induced deep levels, ET1 and ET3, were observed. By varying the rate windows, the temperature dependence of the capture cross section of the two deep levels ET1 and ET2 and ET3 was studied. The temperature behavior of ET2 and ET3 capture cross section is independent on temperature whereas the capture cross section of the deep level ET1 depends strongly on the temperature. It is suggested that electron capturing is govern by a multiphonon process to the level ET1.
  •  
48.
  • Duc, Tran Thien, et al. (author)
  • Radiation-induced defects in GaN bulk grown by halide vapor phase epitaxy
  • 2014
  • In: Applied Physics Letters. - : American Institute of Physics (AIP). - 0003-6951 .- 1077-3118. ; 105:10, s. 102103-
  • Journal article (peer-reviewed)abstract
    • Defects induced by electron irradiation in thick free-standing GaN layers grown by halide vapor phase epitaxy were studied by deep level transient spectroscopy. In as-grown materials, six electron traps, labeled D2 (E-C-0.24 eV), D3 (E-C-0.60 eV), D4 (E-C-0.69 eV), D5 (E-C-0.96 eV), D7 (E-C-1.19 eV), and D8, were observed. After 2MeV electron irradiation at a fluence of 1 x 10(14) cm(-2), three deep electron traps, labeled D1 (E-C-0.12 eV), D5I (E-C-0.89 eV), and D6 (E-C-1.14 eV), were detected. The trap D1 has previously been reported and considered as being related to the nitrogen vacancy. From the annealing behavior and a high introduction rate, the D5I and D6 centers are suggested to be related to primary intrinsic defects.
  •  
49.
  • Duc Tran, Thien, et al. (author)
  • Deep levels in as-grown and electron-irradiated n-type GaN studied by deep level transient spectroscopy and minority carrier transient spectroscopy
  • 2016
  • In: Journal of Applied Physics. - : AIP Publishing. - 0021-8979 .- 1089-7550. ; 119:9
  • Journal article (peer-reviewed)abstract
    • By minority carrier transient spectroscopy on as-grown n-type bulk GaN produced by halide vapor phase epitaxy (HVPE) one hole trap labelled H1 (EV + 0.34 eV) has been detected. After 2 MeV-energy electron irradiation, the concentration of H1 increases and at fluences higher than 5×1014 cm-2, a second hole trap labelled H2 is observed. Simultaneously, the concentration of two electron traps, labelled T1 (EC - 0.12 eV) and T2 (EC - 0.23 eV) increases. By studying the increase of the concentration versus electron irradiation fluences, the introduction rate of T1 and T2 using 2 MeV-energy electrons was determined to 7X10-3 cm-1 and 0.9 cm-1, respectively. Due to the low introduction rate of T1 and the low threading dislocation density in the HVPE bulk GaN material, it is suggested that the defect is associated with a primary defect decorating extended structural defects. The high introduction rate of the trap H1 suggests that the H1 defect is associated with a primary intrinsic defect or a complex.
  •  
50.
  • Duc Tran, Thien, et al. (author)
  • Electronic properties of defects in high-fluence electron irradiated bulk GaN
  • 2016
  • In: Physica status solidi. B, Basic research. - : John Wiley & Sons. - 0370-1972 .- 1521-3951. ; 253:3, s. 521-526
  • Journal article (peer-reviewed)abstract
    • Using deep level transient spectroscopy, deep levels and capture cross sections of defects introduced by high-fluence electron irradiation of thick halide vapour phase epitaxy grown GaN has been studied. After irradiation with 2 MeV electrons to a high-fluence of 5×1016 cm-2, four deep trap levels, labelled T1 (EC – 0.13 eV), T2 (EC – 0.18 eV), T3 (EC – 0.26 eV) T4 and a broad band of peaks consisting of at least two levels could be observed. These defects, except T1 and T3, were annealed out after annealing at 650 K for 2 hours. The capture cross section is found to be temperature independent for T2 and T3, while T1 shows an decresing capture cross section with increasing temperature, suggesting that electron capturing to this deep level is governed by a cascade capturing process.
  •  
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